EMC TEST SYSTEMS FOR AUTOMOTIVE

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EMC TEST SYSTEMS FORAUTOMOTIVE

AUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSAUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSWITH THE 200, YOU GETEVERY WAVEFORM!EM TEST test systems are the perfect solution for all automotive applications. Increasing standards in the areas of technology, safety, comfort, environmental sustainability,as well as the use of alternative drives, have rapidly transformed the automobilemarket, so innovation has become crucial. All of the testing equipment by EM TEST isdesigned with future technology in mind because top performance requires expertise.Ready for the future23

AUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSAUTOMOTIVE EMC TEST SYSTEMSFOR AUTOMOTIVEELECTRONICSAUTOMOTIVE INHALTSVERZEICHNISAND AT 500, THINGS GETREALLY INTERESTING!With the innovative testing equipment by EM TEST for hybrids and e-cars, weare moving into an entirely new dimension of testing in the automotive iewEMC in the automotive industryThe automotive catalog at a glance02–05WHY EM TEST?HighlightsThe EM TEST product range at a glance06–09TRANSIENT IMMUNITYTESTINGIntroductionUCS 200NUCS 200N and LD 200N for all transientsA detailed look at the advantagesFreestyle mode for individual test pulsesA detailed look at the advantagesFreestyle mode for individual test pulsesUCS 200NLD 200NMPG 200S21Introduction to 2426–31A detailed look at the first mobile test laboratoryAutoWaveIntroduction to autowave.controlPFS 200NVDS 200N34–373839–434445Test set-upTransient emissions set48–4950LD 200NTechnical dataTechnical dataTechnical dataSoftwareBATTERY SIMULATIONTRANSIENTEMISSIONS TESTING4AutoWaveTechnical dataSoftwareTechnical dataElectronic switchTechnical dataPageChapterContentPageCONDUCTED ANDRADIATED IMMUNITYCWS 500N2Technical dataSoftwareTest setupsTechnical dataA detailed look at the advantagesCWS 500N2Introduction to icd.controlMagnetic fields, voltage and sine ripplesAMP 200N, CN 200N1ESD TESTSESD 30NDitoESD simulator up to 30 kVESD simulator up to 16.5 kVHYBRID AND ELECTRICVEHICLESIntroductionOverviewTechnical dataA concise overviewThe EM TEST system for HV on-board power supply systemsDPA 500N and NetWave 7.3NetWave (3-phase) DPA 503N and AIF 503N UCS500N7.3 and CNI 503B7.3PFS 503N and MV 3P40100DS (3-phase)72 – 7374 – 7576777879ACCESSORIES FORSUCCESSFUL TESTINGTechnical dataAN 2050 series, CDN 10615N100, RDS 200N, RS-BoxRCB 200N1CA BS 200N, CA ISO, CA EFT, ACC, BCI-probes, ISO-Rack818283– 85USED STANDARDSList of all supported standards for EM TEST equipment86 – 87EM TEST FOR EVERYONEAdditional EMT TEST services88 – 8954 – 555657 – 6062 – 6364 – 6568695

AUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSAUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSWHY EM TEST? OPTIMUM OPERATIONWHY EM TEST? THE LARGEST STANDARDS LIBRARYOUR EQUIPMENTHAS ALWAYS HADTOUCH CONTROL.ONLY MORE INTUITIVE.THE BEST STANDARDSLIBRARY IN THE WORLD!SIMPLY SELECT ONEAND YOU’RE DONE.Round and simple.Enough of the standards chaos:Central operationAll standards and their revisionswith a control dial.are defined and updatedin real-time by EM TEST.67

AUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSAUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSWHY EM TEST? MOBILITY FOR THE FUTURETHE SMALLEST MOBILETEST LABORATORY INTHE WORLD!THE AUTOWAVE.THE AUTOWAVE. THREE DEVICES IN ONE.Schluß mit dem Normenchaos:182alle Normen und deren Editionen3sind definiert und werden laufendvon EM TEST aktualisiertWaveSimulatorWaveRecorderWavePlayerThe AutoWave generatessimple anomalies in theon-board power supply.While executing the on-boardpower supply anomalies, theAutoWave simultaneouslygauges the reaction of theequipment under test.The AutoWave plays backthe power supply anomaliesrecorded in the vehicle.9

AUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSAUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSTRANSIENTIMMUNITY TESTING1011

AUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSUCS 200N & LD 200N:FOR ALL TRANSIENTS.AUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSVirtually 100%* of today’s transient testing in theautomotive sector is conducted by only two EM TESTdevices: the UCS 200N and the LD 200N.* Standards that require specialized implementation (e.g. JASO, pulse E1, E2)1213

AUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSAUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSUCS 200N:VERSATILITY.MODULE CN(COUPLING NETWORK)TYPE CN Central DUT output Overlap of all test pulses on DUT supply line Available in versions up to 60 V, 200 AMODULE EFTISO 7637-2/-3 Pulse 3a, 3b Test voltage up to 1,000 VMODULE MPGISO 7637-2/-3 Pulse 1 (12 V/24 V) Pulse 2a (12 V/24 V) Nearly all international vehicle manufacturerspecificationsMODULE SAESAE J1455 Mutual pulse Inductive pulseMODULE JASOMODULE FREESTYLEPULSE PARAMETERS Test voltage:up to 600 V Rise time:tr 1 μs to 10 μs Pulse duration:td 50 μs to 10,000 μs Internal resistance: Ri 2 Ώ to 450 Ώem.flow OPERATIONAL CONCEPT Extremely easy to operate Parameters can be set even during the test Quick start Standard programs User programs Select directly from standard test levels Statistical test options Predefined testsEASY TO CONNECT IEEE, USB interfaces DUT monitoring, Fail 1, Fail 2 External test generators ACC capacitive coupling clamp, ISO 7637-3 (CCC) BCI clamp, ISO 7637-3 (ICC) External impedance External trigger inputJASO D001, D007, D902A Pulse A2, B2, D2 JASO defines the pulse-forming networkand the components to be usedMODULE NISSANWarning lampSafety circuitNISSAN NDS Puls B2, C8, C50 and C300 Nissan defines the pulse-forming networkand the components to be used1415

AUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSTEST PULSES CUSTOMIZEDEXACTLY FOR YOUR NEEDS:FREESTYLE MODEAUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSFREESTYLE BY HANDStep 1Step 2Step 3: Set the parametersStep 4: Active testImportant features of self-programmable test routines are simplemenu navigation that enables users to access the correct positionquickly and a clearly arranged display that allows quick, easyprogramming.Of course, users can program the equipment itself manually or usethe iso.control soft ware.PROGRAMMING IS EASY:Step 1: Set the parameters trtdRISE TIMEPULSE DURATION from 1 μs to 10 μs from 50 μs to 10,000 μs USAMPLITUDE up to 600 V RiINTERNAL RESISTANCE 2 Ω, 4 Ω, 5 Ω 10 Ω–100 Ω in intervals of 5 Ω 200 Ω, 400 Ω, 450 ΩStep 2: Your test pulse is readytrWaveform withother parametersUsAutomotive technology is increasingly multifaceted and complex. Model updates and replacementoccur more quickly, resulting in interference phenomena that are not covered by existing testprocedures and specifications. The freestyle mode allows users to program their own test pulsesand to update and reconfigure the current capabilities quickly and easily. Programming knowledge is not necessary.16Ua0tdt117

AUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSAUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSLD 200N:THE POWER PACKAGE.MODULE CN(COUPLING NETWORK)TYPE CN Overlap of all load dump pulses onthe DUT supply lineMODULE FREESTYLEGENERATE YOUR OWN TEST PULSE Test voltage:up to 200 V Rise time:tr 1 μs to 10 ms Pulse duration:td 10 ms to 1,200 ms Internal resistance:0.5 Ω bis 38 Ωin intervals of 0.1 ΩMODULE ISOPulse 5a, 5b 12 V on-board power supply 24 V on-board power supplyMODULE SAESAE J1455 12 V on-board power supply 24 V on-board power supplyem.flow OPERATIONAL CONCEPT Extremely easy to operate Parameters can be set even during the test Quick start Standard programs User programs Select directly from standard test levels Statistical test options Predefined testsMODULE JASOJASO D001 Pulse A1, B1, D1 defines the pulse-forming networkand the components to be usedMODULE NISSANEASY TO CONNECT interfaces IEEE, USB DUT monitoring, Fail 1, Fail 2 External trigger input External impedance External control of power supply switch Pulse output for external coupling filters Coupling filter with central DUT outputNISSAN NDS Pulse A1, A2, B1 Nissan defines the pulse-forming networkand the components to be usedMODULE CLIPThe built-in “Clipped Load Dump pulses”(CLD) module enables the generation ofvarious test requirements, i.e. time parametersand clipping levels (Us*) can be set upbetween 15 V and 99.5 V as necessary.18Warning lampSafety circuit19

AUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSLD 200N:CREATE YOUR OWNTEST PULSES WITHFREESTYLE.AUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSFREESTYLE BY HANDStep 1Step 2Step 3: Set the parametersStep 4: Active testImportant features of self-programmable test routines are simplemenu navigation that enables users to access the correct positionquickly and a clearly arranged display that allows quick, easy programming.Of course, users can program manually or use the iso.controlsoft ware.PROGRAMMING IS EASY:Step 1: Set the parameterstrtd RISE TIMEPULSE DURATION from 1 μs to 10 ms from 10 ms to 1,200 ms US AMPLITUDE up to 200 VRiINTERNAL RESISTANCE 0.5 Ω up to 38.0 Ωin intervals of 0.1 ΩStep 2: Your test pulse is readyWaveform withother parameterstrAutomotive technology is increasingly multifaceted and complex. Model updates and replacement occur more quickly, resulting in interference phenomena that are not covered by existingtest procedures and specifications. The freestyle module allows you to program your own testpulses and to update and reconfigure the current capabilities quickly and easily. Programmingknowledge is not necessary.20UaUstd0t121

AUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSAUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSUCS 200N SERIESLD 200N SERIESCOMPACT SIMULATOR FOR AUTOMOTIVE TRANSIENTSLOAD DUMP GENERATOR WITH “CLIP” FUNCTION Load dump simulator per ISO 16750-2, ISO 7637, SAE J1113, For pulses 1, 2a and 3a/3bSAE J1455, JASO, Nissan Test pulses per ISO, JASO, NISSAN, SAEand many car manufacturers’ specificationsand other manufacturers’ specifications Generates “clipped load dump” pulses Manual and remotely controlled operation Freestyle, unrestricted pulse form generation Freestyle, unrestricted pulse form generation Pulse formation with RLC pulse-forming networkThe ultra-compact simulator UCS 200N series for automotive transients combines the capabilities of EFT/burst simulators and micro-pulsesimulators as well as the necessary coupling network – up to 200 Adepending on model – in one device. The UCS 200N series meets allinternational standards and automobile manufacturer specifications.A wide variety of pulse form parameters can be used. The built-in coupling network can be used and controlled with any device from the LD200N, VDS 200N, and PFS 200N ranges.Load dump pulses have high pulse energy, which can be highlydestructive to electrical or electronic equipment. The LD 200Nseries simulates these pulses with high energy in a range of up to1.2 seconds. The LD 200N series generates load dump pulses perthe respective requirements of the ISO 16750-2, ISO 7637, SAE J1113,SUPPORTED STANDARDS (EXCERPT)PRODUCT RANGEInternational:UCS 200N50UCS 200N100Ford, General Motors, Chrysler,UCS 200N150Compact automotive generator 60 V/150 AFord, General Motors, Chrysler,FIAT, PSA, Renault, Volvo, Jaguar/Landrover,UCS 200N200Compact automotive generator 60 V/200 AFIAT, PSA, Renault, Volvo, Jaguar/Landrover,ECE, ISO, JASO, SAE, ETS, GOSTManufacturer*: Audi, BMW, Mercedes, Porsche, Volkswagen,SUPPORTED STANDARDS (EXCERPT)PRODUCT RANGECompact automotive generator 60 V/50 AInternational:LD 200N60 V/30 ACompact automotive generator 60 V/100 AManufacturer*: Audi, BMW, Mercedes, Porsche, Volkswagen,LD 200N10060 V/100 A with power supply switchLD 200N20060 V/200 A with power supply switchECE, ISO, JASO, SAE, ETS, GOSTHyundai/KIA, Honda, Mazda, Nissan, Toyota,Hyundai/KIA, Honda, Mazda, Nissan, Toyota,Freightliner, Mack Trucks, MAN, Scania, Paccar,Freightliner, Mack Trucks, MAN, Scania, Paccar,Ssangyoung, Tata MotorsSsangyoung, Tata Motors*Supported standards, see page 86*Supported standards, see page 86TECHNICAL DATA (EXCERPT)GENERATED PULSES22SAE J1455 and JASO standards and nearly all international manufacturers’ specifications e.g. Ford, Chrysler, Renault, PSA, Nissan, etc.With the built-in clipping module, the LD 200N series also generatesload dump pulses per international standards and manufacturerspecifications.Pulse 3aPulse B2 (JASO)Pulse 3bPulse D2 (JASO)Pulse 3a (sweep)Pulse B2 (Nissan)Pulse 3b (sweep)Pulse C8 (Nissan)Pulse 1 (1/1000)Pulse C50 (Nissan)Dimensions, weightUCS 200N50UCS 200N100UCS 200N150UCS 200N200TECHNICAL DATA (EXCERPT)GENERATED PULSES19”19”19”19”3 HU6 HU6 HU6 HUapprox. 25 kgapprox. 29 kgapprox. 35 kgapprox. 35 kgPower supply115/230 V 10/-15%Fuses4 AT (115 V)/2 AT (230 V)Serial interfaceUSBParallel interfaceIEEE 488, addresses 1 to 30Dimensions, weightLD 200N19” 6 HU (290 mm) approx. 25 kgLD 200N100 19” 9 HU (420 mm) approx. 39 kgLD 200N200 19” 9 HU (420 mm) approx. 42 kgDUT supplyMax. 60 V/30 A ; 100 A ; 200 AOn-board power supplyinternal switch100 A (LD 200N100)200 A (LD 200N200)Supply voltage115/230 V 10/-15%Pulse 5Pulse 5 Ford - CSPulse 5 clippedPulse 5 ChryslerField decayPulse 5 Chrysler, clippedPulse SAE 12 VPulse 5 Chrysler rampPulse SAE 24 VPulse Nissan A1Fuses2 x 4 AT (115 V)/2 x 2 AT (230 V) /- OutputSafety laboratory plugSerial interfaceUSBPulse 1 (1/2000)Pulse C300 (Nissan)Pulse JASO A1Pulse Nissan A2Pulse 1 (1/6000)Pulse, inductive (SAE)Pulse JASO B1Pulse Nissan B1 (Pos.)Pulse 1 (3/1000)Pulse, mutual (SAE)Pulse JASO D1Pulse Nissan B1 (Neg.)Pulse 1 (3/2000)Pulse 1b (DC11224)Pulse 5 MBN 12 VPulse 5 Scania, busPulse 2a (1/50)Pulse D (Ford CI 220)Pulse 5 MBN 24 VPulse 5 Scania, truckPulse 6Pulse 1 up to (PSA B217110C – Pos)Pulse 5 Ford - ABPulse 5a AllisonPulse A2 (JASO)Pulse 1b (MBN10284 – 24V)Pulse 5 Ford - ACParallel interfaceIEEE 488, addresses 1 to 30CN interface LD 200NFor controlling of the external coupling networkfrom the UCS 200N series with integrated batteryswitch23

AUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSAUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSMPG 200S21TEST PULSE E1 AND E2 FOR JASO D 001-94 Tests for JASO D 001-94 Test pulse E1, E2 Integrated electronic battery switch Coupling network for up to 60 V/50 A DCThe MPG 200S21 contains exactly the elements prescribed in the JASOstandard for generating E1 and E2 pulses for 24 V systems per JASO D00194. The built-in electronic battery switch interrupts the DC voltage supply.The standalone test simulator with the 60 V/50 A DC coupling/decouplingnetwork can be easily integrated into an existing test system. It can beoperated manually or with software via the GPIB or USB interfaces.DATASHEETSFOR ALL OF OUREQUIPMENT CANBE FOUND AT:www.emtest.comSUPPORTED STANDARDS JASO D001-94PRODUCT RANGEGENERATED PULSESMPG 200S21JASO pulse E1Pulse E1, E2JASO pulse E2TECHNICAL DATATECHNICAL DATAImpulse voltage20 V–500 VPulse E2PolaritynegativeCapacitor voltageVc -320 VRepetition rate1.0 s–99.0 sCapacitor C2,000 μFRise time 1 μs (0%–100%)Pulse E1Capacitor voltageVc -457 VCapacitor C1,000 μFRise time 1 μs (0%–100%)Pulse duration tau (36.8%)26 ms 20%R2 resistance27 Ω 10%R3 resistance300 Ω 10%24Pulse duration tau (36.8%)26 ms 20%R2 resistance13 Ω 10%R3 resistance210 Ω 10%Supply voltage115 /230 V 10 /-15% (optional 100 V)Fuses2 x 2 AT (115 V)/2 x 1 AT (230 V)Dimensions19" 3 HU (394 mm x 484 mm x 154 mm)Weight13.0 kg25

AUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSISO.CONTROL:MAKES THE COMPLEXEASYAUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSWith iso.control everything is right there for you. It’s neverbeen so easy to create and document test runs.iso.controlSoftware2627

AUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSAUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSFrom the first standard selection to the completed test report, the iso.control softwareoffers everything that you expect from user-friendly EMC test software, which meansthat it is compatible with EM TEST hardware as well. Brilliant.iso.controlSoftware“EVERY TEST STANDARD ATYOUR FINGERTIPS: PERFECT!”“EASY TO INTEGRATE: EXTERNAL MEASURINGDEVICES AND ADDITIONAL ACCESSORIES”01 STANDARD SELECTION (STANDARDS LIBRARY)03 ESSENTIAL ACCESSORIESA comprehensive library contains EVERYTHING:Today’s DUTs (devices under test) are very complex. Their operationrequires a wide variety of accessories and auxiliary devices. To ensurethat test results are reproducible, all of the accessories and auxiliarydevices used in the test set-up must be documented in the test report.National/International:Here are the ISO, DIN, ECE, EN, ETS (communication),JASO and SAE standards.The iso.control has a library just for that purpose!Manufacturer specifications:Selection is organized by European, American, Japanese and other Asianvehicle and commercial manufacturers.2802 TEST PULSE SELECTION04 MEASURING DEVICE INTEGRATION/SELECTIONTo create your own specification, you can switch from the standard libraryto the “Device mode” section, where you’ll find all of the available testpulses for the selected device.An oscilloscope is often required, e.g. in a function test prior to testingor a pulse verification per ISO 7637-2 (annex D). EM TEST supplies a driverlibrary for this purpose.Choose the ones you need, create your test routines and save them.Then you can always access these test routines with a single click.If the necessary driver is not available, you can easily expand the libraryyourself in just a couple of minutes.29

AUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSAUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICSAutomated test runs are completely preprogrammed with the Easy Link.Just click the desired tests and start them. Custom test routines canbe created easily with the link generator.iso.controlSoftware“IN A CLASS BY ITSELF: COMPOSE FULLYAUTOMATIC TESTS”“ABSOLUTE CONTROL.” TEST EXECUTIONAND TEST RESULTS ARE ALWAYS IN VIEW.05 EASY LINK FUNCTION07 TEST EXECUTIONFully automatic test routines can be created.Test is started Current test pulse and all test parameters are displayed.With the EASY LINK function, it’s quite easy connect test pulses andpower supply anomalies from the library.You can interrupt the test, move on to the next text or cancel the test atany time.Of course you can enter a comment for each step executed so thatEVERYTHING is documented afterwards. When using an externalmeasuring device for test monitoring, you define the steps manuallyfirst, then the measuring device executes them automatically.06 TEST ROUTINESFully automatic test routines can be created with the link generator.In the link file, test files are compiled into a fully automatic test routine.The iso.control software takes charge of all of the measuring and testdevices.You can concentrate fully on your DUT while iso.control handleseverything else.AccessoriesTel:Fax:Email:http:// Test Equipment 1 Test Report iso.controlV343443Test Equipment 3V4542355Test Equipment 4V3534556Test Equipment 5V545454Test Equipment 6V098089Test Equipment 8V0707070Test Equipment 9V0789089Date of test:July-25-2013, 16:06Test Equipment 10Michael MeierCustomer:Customer EM TEST GmbHStandard:ISO 7637-2 (2011-03)Application:24 V systemAmbientTemperature:22 CHumidity:50 %Pressure:96 kPaNote:Here are the NotesTestISO 7637-2 (2011-03) : 4.6.3 Pulse 3bTest l 300101090515050Battery1000000123Current est duration:Test passed !(Date)Software No.:Serial No.:Va (Alternator):ResultResult:V98563498ProcedurePulse Name:Testiso.control registers test interruptions, recognizes DUT operational condit

AUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICS AUTOMOTIVE EMC TEST SYSTEMS FOR AUTOMOTIVE ELECTRONICS Step 1 Step 2 Step 3: Set the parameters Step 4: Active test. Load dump pulses have high pulse energy, which can be highly destructive to electrical or electronic equipment. The LD 200N series simulates these pulses with high energy in a range of up to 1.2 seconds. The LD 200N .

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