How To C Hoos E And Apply Source Measure Unit Instruments
Selector Guideag r e at e rm e a s u r eHowo fMore Informationc o n f i d e n c etoChooseandApplySource Measure Unit InstrumentsINSTRUMENT SELECTIONnKEY APPLICATIONSnMEASUREMENT CAPABILITIESKeithley’s SMU legacy. 2Choosing the Right SMU. 3Model 2450 Advanced Touchscreen SourceMeter instrument. 4Series 2600B System SourceMeter instruments. 6Model 2651A High Power /High Current System SourceMeter instrument . 8Model 2657A High Power /High Voltage System SourceMeter instrument. 10Series 2400 SourceMeter instruments. 12Model 6430 Sub-Femtoamp Remote SourceMeter instrument. 14SMU Selector Guide. 15For More Information. 16start
Selector GuideMore InformationpreviousindexnextDiscover how you benefit from our legacy of innovationin source measure unit (SMU) instrument engineeringOur latest generation of System SourceMeter instruments are the T&M industry’s most powerful, fastest andhighest resolution SMU instruments. When used individually, they bring together everything we’ve learned aboutengineering instruments that deliver unparalleled performance. They’re also flexible, efficient, I-V source andmeasure building blocks for creating fast, powerful, and cost-effective test and measurement systems for electronicdevices. Keithley has been a leading provider of integrated sourcing and measurement solutions since the late 1980s,when we introduced our first generation of SMU instruments.First half-rack, DMM-like SMUinstrument (Model 2400)First two-channel, half-rack SMU instrument (Model 2602)First script-based SMU instrument (Models 2601/2602)First instrument-based SMU(Series 23X)20051989First 1000V SMUinstrument (Model 237)1995Industry’s first touchscreen SMU instrument the Model 2450Offers the capabilities of analyzers, curve tracers,and I-V systems, curve tracers, and semiconductoranalyzers at a fraction of their cost.20112000today2008First one-kilowatt pulsedSMU instrument (Model 2430)First SMU instrument with parallel testexpansion capability (Series 2600A)First sub-femtoamp SMUinstrument (Model 6430)First one-microsecond per point digitizing SMU instrument (Model 2651A)First 200W DC, 2000W pulsed SMU instrument (Model 2651A)2H o w to C h o o s e a n d A p p ly S o u r c e M e a s u r e U n i t I n s t r u m e n t sSeries 2600B SourceMeter SMU InstrumentsThree new benchtop models offer best-in-classvalue and performanceFirst 3,000V, 180W SMU with 1fA current measurement resolution (Model 2657A)Ag r e at e rm e a s u r eo fc o n f i d e n c e
Selector GuideMore InformationpreviousindexnextLearn how to choose the right SMU for your applicationThe popularity of SMU instruments has increased rapidly as more people discover that their tightly-integratedDMM and precision power supply capabilities can serve a wide variety of applications throughout the electronicsand semiconductor industries. Learn how to evaluate instrument specifications carefully in order to choose themost appropriate SMU for a specific application. View our online webinar.nRead these white papers:– Choosing the Optimal Source MeasurementUnit Instrument for Your Test and MeasurementApplication– Rapidly Expanding Array of Test ApplicationsContinues to Drive Source Measurement UnitInstrument Technology– Get in Touch with theChanging User Interfaceof Test InstrumentsClick here for an online discussion of SMU instrumentsversus power supplies or DMMsWant assistance, a quote, or to place an order?Contact us online.nJoin the discussion on our application forum.3H o w to C h o o s e a n d A p p ly S o u r c e M e a s u r e U n i t I n s t r u m e n t sAg r e at e rm e a s u r eo fc o n f i d e n c e
Selector GuideMore InformationpreviousindexnextTouch, Test, Invent with the intuitivelysmart, touchscreen SMULearn faster, work smarter, and invent easier with the Model 2450 Touchscreen SMU Instrument,an innovative, compact I-V solution that offers the capabilities of I-V systems, curve tracers, andsemiconductor analyzers at a fraction of their cost.n Source and measure voltage, current, and resistance in a single instrumentn Advanced capacitive touchscreen enables a superior user experience for novice or experiencedSMU usersn Faster speed to answer without paging through a manualn Graphical interface provides I-V curve tracing functionality for a fraction of the cost oftraditional curve tracersn Extended low-level voltage, current, and resistance capabilities provide the application versatilitythat makes it the SMU for everyoneQuad. IIThe 2450 graphical interface provides I-V curve tracing functionalityat a fraction of traditional curve tracer cost.Quad. I 1A 100mAGet More Done in Less Time-200V-20V 20VThe Model 2450 features an advanced, full-color, five-inchcapacitive touchscreen with multi-point, pan-pinch-zoom-swipeoperation that is incredibly easy to use right from power-on. 200V-100mAQuad. III-1AWant assistance, a quote, or to place an order?Contact us online.Quad. IVClick here to learn moreInteractive touchscreen enables a superior user experience.nJoin the discussion on our application forum.4H o w to C h o o s e a n d A p p ly S o u r c e M e a s u r e U n i t I n s t r u m e n t sAg r e at e rm e a s u r eo fc o n f i d e n c e
Selector GuideMore InformationpreviousindexnextThe go-to instrument that everyone’s got to haveThe Model 2450 is ideal for I-V functional test and characterization of a wide range of today’s modern electronic devices, including scaledsemiconductors, nano-scale devices and materials, organic /printed electronics, and other current and voltage testing applications.A Smart Toolkit Beyond the TouchscreenFront panel includes a HELP key, rotary navigation/control knob, front/rear input selectorbutton, and banana jacks for basic bench applications.Ready to learn more?– Download the Model 2450 data sheet.– Download the Model 2450 brochure.– View the Model 2450 product tour.Built-in connectivity options speed and simplify overcoming today’s andtomorrow’s measurement challenges.Read these application notes:– Easy I-V Characterization of Diodes Using the Model 2450: In particular, thisapplication note describes how to take, graph, and store measurements using the frontpanel user interface, as well as how to automate the measurements over the bus.– I-V Characterization of Photovoltaic Cells Using the Model 2450: Thisapplication note explains how to perform I-V testing from the Model 2450 frontWant assistance, a quote, or to place an order?panel, including how to generate graphs and save the data to a USB drive. It alsoContact us online.details how to automate the measurements over the bus.– Rechargeable Battery Charge/Discharge Cycling Using the Model 2450:Learn how battery testing can be simplified by using a single instrument that hasthe flexibility to source/sink current as well as measurevoltage and current.nJoin the discussion on our application forum.5H o w to C h o o s e a n d A p p ly S o u r c e M e a s u r e U n i t I n s t r u m e n t sAg r e at e rm e a s u r eo fc o n f i d e n c e
Selector GuideMore InformationpreviousindexnextDiscover how the Series 2600B family ofSystem SourceMeter instruments simplifieshigh speed R&D and functional testingSeries 2600B System SourceMeter instruments are designed for use as either bench-top I-V characterization tools or asbuilding block components of multi-channel I-V test systems. Mix and match single- and dual-channel instruments forflexibility in building larger test systems. Individual models include:n Models 2602B and 2604B (Dual Channel Benchtop), and Model 2601B (Single Channel). Scalable,High Throughput. Learn more.n Models 2612B and 2614B (Dual Channel Benchtop), and Model 2611B (Single Channel). High voltage andpulsed output. Learn more.n Models 2636B and 2634B (Dual Channel Benchtop), and Model 2635B (Single Channel). Low current andpulsed output. Learn more.n Model 2651A (Single Channel). High Current. Learn more.n Model 2657A (Single Channel). High power/high voltage, lowcurrent and pulsed output. Learn more.Common characteristics:n Every model combines a power supply, true current source, DMM, arbitrarywaveform generator, V or I pulse generator with measurement, electronicload, and trigger controller all in one instrumentn Family of products offers wide dynamic range(10A pulse to 0.1fA, 200V to 100nv)n 20,000 rdgs/s (using integrating ADCs)n Precision timing and channel synchronization ( 500ns)Parallel testing with Series 2600B instruments. Each instrument in the system runs itsown complete test sequence, creating a fully multi-threaded test environment. Testthroughput is dramatically improved and the overall cost of test is reduced.Equally suited to the bench and the rackn In bench-top applications, you can quickly and easily perform common I-V tests without programming by using the free browser-basedPlug & Play I/V characterization software provided with every instrument.n For system-level applications, the Series 2600B’s TSP-Link bus supports dedicated trigger lines that provide synchronous operationsbetween multiple Series 2600B instruments and other Test Script Processor (TSP ) technology-enabled instruments, such as Series3700A DMM/Switch Systems without the need for additional trigger connections. TSP and TSP-Link architecture provides the highestthroughput in the industry, lowering your cost of test.n A free Test Script Builder software tool helps you create, modify, debug, and store TSP test scripts for either bench or system applications.To make it easier to test, verify, and analyze semiconductor components, optional ACS Basic Edition software is also available.Click here to learn moreH o w to C h o o s e a n d A p p ly S o u r c e M e a s u r e U n i t I n s t r u m e n t sSeries 2600B ApplicationsI-V functional test and characterization of a wide range of devices,including:n Discrete and passive components– Two-leaded – Sensors, disk drive heads, MOVs, diodes,zener diodes, sensors, capacitors, thermistors– Three-leaded – Small signal BJTs, FETs, and moren Simple ICs – Optos, drivers, switches, sensorsn Integrated devices – Analog ICs, RFICs, ASICs, SOC devicesn Optoelectronic devices such as LEDs, laser diodes, HBLEDs,VCSELs, displaysn Wafer level reliability – NBTI, TDDB, HCI, electromigrationn Solar cellsn BatteriesWant assistance, a quote, or to place an order?Contact us online.nJoin the discussion on our application forum.6Ag r e at e rm e a s u r eo fc o n f i d e n c e
Selector GuideMore InformationpreviousindexnextReady to learn more?nDownload the Series 2600B data sheet.nRead an application note:– High Speed Testing of High BrightnessLEDs – Learn how to achieve throughputadvantages and reduce the cost of test byusing new test technologies, includinginstruments enabled with an embeddedTest Script Processor.Plug & Play software:– Methods to Achieve Higher Currents fromI-V Measurement Equipment – DiscoverView this demonstration of Java-based Plug& Play test software for I/V characterizationof devices.how to achieve current levels during testsequencing that are higher than the publishedDC (direct current) specifications of a singleSMU instrument.nTest applications:– Migrating from Keithley’s Series 2400 SourceMeter SMU instrument toa Series 2600B SourceMeter SMU Instrument? Learn how the new ModelWant assistance, a quote, or to place an order?Contact us online.2600B instrument is capable of emulating the mode of operation of the Model 2400by accepting SCPI commands.nJoin the discussion on our application forum.7H o w to C h o o s e a n d A p p ly S o u r c e M e a s u r e U n i t I n s t r u m e n t sAg r e at e rm e a s u r eo fc o n f i d e n c e
Selector GuideMore InformationpreviousindexnextGet unmatched performance for characterizing andtesting high power, high current electronicsOur Model 2651A High Power System SourceMeter Instrument simplifiescharacterizing today’s challenging high power electronics with unprecedented power,precision, speed, flexibility, and ease of use. It combines a highly flexible, four-quadrantvoltage and current source/load with precision voltage and current meters.n Source or sink 2,000W of pulsed power ( 40V, 50A), 200W of DC power( 10V@ 20A, 20V@ 10A, 40V@ 5A)n Easily connect two units (in series or parallel) to create solutions up to 100A or 80Vn 1pA resolution enables precise measurement of very low leakage currentsn 1μs per point (1MHz), continuous 18-bit sampling, accurately characterizes transient behaviorChoice of digitizing or integrating measurement modesWith the Model 2651A, you can choose from either digitizing or integrating measurement modes for precisecharacterization of both transient and steady-state behavior. Two independent ADCs define each mode—one for current and the other for voltage—which run simultaneously for accurate source readback withoutsacrificing test throughput. The digitizing measurement mode’s 18-bit ADCs can support continuous onemicrosecond-per-point sampling, making it ideal 50Afor waveform capture and measuring transientcharacteristics with high precision. Theintegrating measurement mode, based on 22-bitADCs, supports applications that demand the 20Ahighest possible measurement accuracy and 10A 5Aresolution. This ensures precise measurements 0A–5Aof the very low currents and voltages common in –10Anext-generation devices.Model 2651A Applicationsn Power semiconductor, high brightnessLED (HBLED), and optical devicecharacterization and testingn Characterization of GaN, SiC, and othercompound materials and devicesn Semiconductor junction temperaturecharacterizationn Reliability testingn High speed, high precision digitizationn Electromigration studiesDC andPulsePulseonly2651A2651ATSP-LinkLXI or GPIBto PCController26XXBUp to100A–20AClick here to learn moreBuilt for building systems. The embedded TSP controller and TSP-Linkinterface in each Series 2600B instrument make it easy to link multipleWantassistance,a quote,or to placean anorder?Model2651Asand other Series2600B instrumentsto createintegratedtest system with up to 64 channels. Precision timing and tight channelContact usareonline.synchronizationguaranteed with built-in 500ns trigger controllers. Thefully isolated, independent channels of Series 2600B instruments allowtruetesting without the power and/or channel limitations ofn SMU-per-pinJointhediscussionon our application forum.mainframe-based systems.–50A–40V–20V–10V0V 10V 20V 40VA single Model 2651A unit can source and sink up to 40V and 50A. Connect two units in parallel via the builtin TSP-Link expansion bus to extend the system’s current range to 100A or connect them in series to expandthe voltage range to 80V. The embedded Test Script Processor (TSP ) technology simplifies testing by allowingyou to address multiple units as a single instrument so that they act in concert. The built-in trigger controller cansynchronize the operation of all linked channels to within 500 nanoseconds.8C ost- effective , high performa n ce sourci n g a n d measureme n t solutio n sAg r e at e rm e a s u r eo fc o n f i d e n c e
Selector GuideMore InformationpreviousindexnextReady to learn more?nDownload the Model 2651A data sheet.nRead these application briefs:– Achieving Fast Pulse Measurementsfor Today’s High Power Devices.Learn how to achieve the fast, pulsedmeasurements needed for today’s highpower devices.– Testing to 100A by CombiningModel 2651A High PowerSourceMeter Instruments.Click on the video above to view our demo of how you cancombine two Model 2651As to source currents as high as 100A!Learn how two of theseinstruments can be combined totest semiconductor devices forpower management, even whenthose devices operate at currentsbeyond that of a single Model 2651Ainstrument.Want assistance, a quote, or to place an order?Contact us online.nJoin the discussion on our application forum.9H o w to C h o o s e a n d A p p ly S o u r c e M e a s u r e U n i t I n s t r u m e n t sAg r e at e rm e a s u r eo fc o n f i d e n c e
Selector GuideMore InformationpreviousindexnextCharacterize and test high voltage electronics and power semiconductorsThe Model 2657A High Power System SourceMeter Instrument is suitable for R&D,production, and QA/FA. The Model 2657A:n Sources or sinks up to 3000V @ 20mA or 1500V @ 120mA – to capture importantparametric data that other equipment can’tn Provides 1fA (femtoamp) current measurement resolution for measuring the lowleakage requirements of next-generation devicesn Eliminates the hassle of integrating power supplies and instruments by combining aprecision power supply, current source, DMM, arbitrary waveform generator, V or I pulse generator,electronic 18-bit load, and trigger controller.Like the Model 2651A, the Model 2657A comeswith dual 22-bit precision ADCs and dual 18bit 1μs per point digitizers for high accuracyand high speed transient capture. Like otherSeries 2600B SMU instruments, it includesTSP Express characterization software,LabVIEW driver, and Keithley’s Test ScriptBuilder software development environment.Model 2657A Applicationsn Power semiconductor device characterizationand testingn Characterization of GaN, SiC, and othercompound materials and devicesn Breakdown and leakage testing to 3kVn Characterization of sub-millisecond transientsClick here to learn moreThe Model 2657A can source or sink up to3000V @ 20mA or 1500V @ 120mA.Keithley offers a broad spectrum of tools, both hardware and software, for power device characterization. A typical devicetest system could include the high voltage Model 2657A, one or two high current Model 2651A instruments, and up to threelow power SMU instruments (other Series 2600B instruments or the Model 4200-SCS semiconductor characterization system).System configuration is made safer and simpler with the optional new Model 8010 High Power Device Test Fixture or individualprotection modules. TSP-Link technology links Series 2600B instruments to form powerful multi-channel systems that rivalthe system speed of large ATE systems that cost tens of thousands of dollars more.Want assistance, a quote, or to place an order?Contact us online.Learn How to Perform a Simple Breakdown Test on a High Power, High Voltage IGBT Device. Click here.nJoin the discussion on our application forum.10H o w to C h o o s e a n d A p p ly S o u r c e M e a s u r e U n i t I n s t r u m e n t sAg r e at e rm e a s u r eo fc o n f i d e n c e
Selector GuideMore InformationpreviousindexnextReady to learn more?nDownload the Model 2657A data sheet.nRead the application note:– Creating Multi-SMU Systems for High PowerSemiconductor Characterization.Click on the video above – Learn how to Perform a SimpleBreakdown Test on a High Power, High Voltage IGBT Device.The recent push for higher power, more efficientsemiconductor devices has spurred the developmentof devices based on advanced materials thatsurpass the limitations of devices built on silicon. DCcharacterization of power semiconductor devicesrequires test systems that incorporate high voltage andhigh current SMUs. The steps required to properly buildthese test systems are detailed in this new applicationnote. More.Want assistance, a quote, or to place an order?Contact us online.nJoin the discussion on our application forum.11H o w to C h o o s e a n d A p p ly S o u r c e M e a s u r e U n i t I n s t r u m e n t sAg r e at e rm e a s u r eo fc o n f i d e n c e
Selector GuideMore InformationpreviousindexnextExplore the Series 2400 SourceMeter instrument familySeries 2400 SourceMeter instruments are designed specifically for testing devices that demand tightlycoupled precision voltage and current sourcing as well as measurement capabilities. Each is a single-channelinstrument that is both a highly stable DC power source and a true instrument-grade 6½-digit multimeter.The power source characteristics include low noise, precision, and readback. The multimeter capabilitiesinclude high repeatability and low noise. The result is a compact, single-channel, DC parametric tester.n Six models: 20–100W DC, 1000W pulsed, 1100V to 1μV, 10A to 10pAn Source and sink (4-quadrant) operation, plus 2-, 4-, and 6-wire ohms functionsn 0.012% basic DCV measure accuracy with 6½-digit resolutionn Available high speed sense lead contact check functionn Programmable DIO port for automation/handler/prober controln Up to 1700 readings/second at 4½ digits via the GPIB busn 5000 6½-digit readings can be stored in the non-volatile buffer memoryBuilt-In Test SequencerThe Series 2400 Source Memory list provides faster and easier testing by allowing you to set up andexecute up to 100 different test setups that can run without PC intervention.n Stores up to 100 individual test configurations, each containing unique source settings, measurementSeries 2400 SourceMeter instruments are easy to set up and use,providing convenient DMM-like operation, while eliminating manyof the connection, compatibility, and synchronization problems thatoccur when multiple instruments are used. You can source voltage orcurrent while making measurements without changing connections.This not only makes it easier to use, it saves test time.settings, pass/fail criteria, etc., linked together to form a complete test suiten Pass/fail limit test as fast as 500μs per point with onboard comparator that eliminates the delay causedwhen sending data to the computer for analysisn Built-in, user definable math functions to calculate derived parametersSeries 2400 Applicationsn Devices including discrete semiconductor devices, passive devices, transient suppression devices,ICs, RFICs, MMICs, laser diodes, laser diode modules, LEDs, photodetectors, circuit protectiondevices (TVS, MOV, fuses, etc.), connectors, switches, relaysn Tests including low voltages/resistances, LIV, IDDQ, I-V characterization, isolation and traceresistance, temperature coefficient, forward voltage, reverse breakdown, leakage current, DCparametric test, DC power source, HIPOT, dielectric withstandingWant assistance, a quote, or to place an order?Contact us online.nClick here to learn moreJoin the discussion on our application forum.12H o w to C h o o s e a n d A p p ly S o u r c e M e a s u r e U n i t I n s t r u m e n t sAg r e at e rm e a s u r eo fc o n f i d e n c e
Selector GuideMore InformationpreviousindexnextReady to learn more?nDownload the Series 2400 data sheet.nRead these application notes:– Diode Production Testing with the Series2400 SourceMeter Instrument – Readabout the three basic DC parametric tests mostdiodes undergo during final inspection: forwardvoltage, breakdown voltage, and leakagecurrent test.Click on the video above - Learn how to usesaved setups with the Series 2400 SourceMeterInstrument Family.– Measuring Photovoltaic Cell I-VCharacteristics with the Model 2420SourceMeter Instrument – Discover how touse the Model 2420 High Current SourceMeterinstrument to measure the current-voltage (I-V)characteristics of photovoltaic cells in order tocharacterize their conversion efficiency.Want assistance, a quote, or to place an order?Contact us online.nJoin the discussion on our application forum.13H o w to C h o o s e a n d A p p ly S o u r c e M e a s u r e U n i t I n s t r u m e n t sAg r e at e rm e a s u r eo fc o n f i d e n c e
Selector GuideMore InformationpreviousindexnextWhen you need the lowest noise and drift specificationsavailable, choose the Model 6430 SMU instrumentThe Model 6430 Sub-Femtoamp Remote SourceMeter instrumentoffers you sensitivity, noise, and input resistance specifications superior to anelectrometer’s. It also offers the lowest noise (just 400aA p-p) and best longterm stability of any instrument available.n Measures current, voltage, and resistancen 0.4fAp-p noisen 1016Ω input resistance on voltage measurementsn 6½-digit resolutionn Up to 2000 source/measure readings/secondn Programmable digital I/O and GPIB interfaces for fast componentcharacterization or selectionThe Model 6430’s Remote PreAmp provides a very sensitive bi-directionalamplifier with sensitive feedback elements for measuring or sourcingcurrents at the DUT. The amplified signals the Remote PreAmp producesare not subject to cable noise as they are carried to the controllingmainframe. This architecture makes the Model 6430 the most sensitivecurrent measurement instrument on the market.Want to learn more?n Download theModel 6430 datasheet.nModel 6430 Applicationsn Low current measurements– Particle beam experiments, including precisionmass spectrometry– Single-electron tunneling and otherquantum experimentsn High resistance measurements– Research on insulators, dielectrics, polymers, etc.– Precise measurements of high resistancesn Four-terminal low resistance measurementsn Semiconductor research and characterization– Measuring sub-femtoamp gate currents– Characterizing sub-threshold I-V curves– Characterizing prober performancen Component testing– Development labs– Production facilitiesLearn how to make highresistance measurements.Click here.– Learn how to apply theModel 6430 to both constantvoltage and constant currenttechniques for resistancemeasurement.Want assistance, a quote, or to place an order?Contact us online.nJoin the discussion on our application forum.14H o w to C h o o s e a n d A p p ly S o u r c e M e a s u r e U n i t I n s t r u m e n t sAg r e at e rm e a s u r eo fc o n f i d e n c e
Selector GuideMore InformationpreviousindexnextSourceMeter SMU instruments selector guideFeature2651A / 2657AHigh Current / High Voltage2634B / 2635B / 2636BLow Current2602B / 2612BDual Channel2601B / 2611BSingle Channel2604B / 2614B DualChannel Benchtop# of Channels1 (optional expansion to 32 via TSP-Link )1 – 2 (optional expansion to 64 viaTSP Link for 2635B/2363B)2 (optional expansion to 64 viaTSP-Link)1 (optional expansionto 32 via TSP-Link)2Current Max / Min2651A: 50A pulse/100fA2657A: 120mA/1fA2634B: 10A pulse/1fA2636B, 2635B:10A pulse/0.1fA10A pulse/100fA10A pulse/100fA10A pulse/100 fAVoltage Max / Min2651A: 40V/100nV2657A: 3,000V/100nV200V/100nV40V/100nV for 2602B200V/100nV for 2612B40V/100nV for 2601B200V/100nV for 2611B40V/100nV for 2604B200V/100nV for 2614BSystem-LevelAutomationDigital l/O, TSP-Link,Contact CheckDigital l/O, TSP-Link,Contact Check (not available on2634B)Digital l/O, TSP-Link,Contact CheckDigital l/O, TSP-Link,Contact CheckN/AMax readings / sec38,5001µSec/pt.,18-bit digitizer20,00020,00020,00020,000Computer InterfaceGPIB, LAN (LXI), RS-232GPIB, LAN (LXI), RS-232, USBGPIB, LAN (LXI), RS-232, USBGPIB, LAN (LXI), RS-232, USBGPIB, LAN (LXI), RS-232,USBConnectors/Cabling2651A: Screw terminal,adaptors for banana2657A: HV triax, SHVTriaxScrew terminal, adaptors forbanana or triaxScrew terminal, adaptors forbanana or triaxScrew terminal, adaptors forbanana or triaxFeature6430 Low I SourceMeter2430 High PowerSourceMeter Instrument2410 High V SourceMeterInstrument2420 / 2425 / 2440 High ISourceMeter Instruments2400 / 2401 Low PowerSourceMeter Instruments2450 Advanced TouchscreenSourceMeter InstrumentsCurrent Max / Min105mA / 10aA10.5A pulse / 100pA1.05A / 10pA5.25A/ 100pA1.05A / 10pA1.05A/10fAVoltage Max / Min200V / 1uV200V / 1uV1100V / 1uV100V / 1uV200V / 1uV200V/10nVPower2W1100W22W110W22W20WMax readings / sec2562,0002,0002,0002,0003,100InterfaceGPIB, RS-232, Digital I/O,Trigger Link Trigger BusGPIB, RS-232, Digital I/O,Trigger Link Trigger BusGPIB, RS-232, Digital I/O,Trigger Link Trigger BusGPIB, RS-232, Digital I/O,Trigger Link Trigger BusGPIB, RS-232, Digital I/O,Trigger Link Trigger BusGPIB, USB 2.0, LAN/LXI,Digital I/O, TSP-LinkConnectorsTriaxBanana (front / rear)Banana (front / rear)Banana (front / rear)Banana (front / rear)Banana (front) Triax (rear)15H o w to C h o o s e a n d A p p ly S o u r c e M e a s u r e U n i t I n s t r u m e n t sAg r e at e rm e a s u r eo fc o n f i d e n c e
indexWant to learn more about applications forKeithley’s growing family of SMU instruments?Keithley Instruments hosts an online applications forum to encourage ideaexchange and discussions among users. Join the conversation today.To learn more about how Keithley’s high performance SMU instruments canenhance the productivity of your test and measurement applications, contact yourlocal Keithley representative or ask us a question online.Contact us by phone, fax, mail, or email:Consult with a Keithley applications engineer and learn howto get the most from your Keithley productsKeithley Corporate HeadquartersKeithley Instruments, Inc.28775 Aurora RoadCleveland, Ohio 44139Phone: 440-248-0400Toll-free: 800-552-1115Fax: 440-248-6168info@keithley.comWORLDWIDE HEADQUARTERSWithin the USA: 1-888-534-8453Outside the USA: 1-440-248-0400Email: applications@keithley.comAdditional contact information at www.keithley.comEUROPEGermany: (49) 89-84930740ASIAChina:Japan:Korea:Taiwan:(86) 10-8447-5556(81) 3-6714-30(82) 2-6917-5000(886) 3-572-9077Specifications are subject to change without notice. All Keithley trademarks and trade names are the property of Keithley Instruments, Inc. All other trademarks and trade names are the property of their respective companies.A Greater Measure of ConfidenceK EIT H L E Y INSTRUMENTS , INC . 2 8 7 7 5 A UROR A RD . C L E V E L A ND , O H 4 4 1 3 9 - 1 8 9 1 440-248-0400 Fax: 440-248-6168 1 - 8 8 8 - K EIT H L E Y www.keithley.comBENELUX 31-40-267-5506www.keithley.nlFRANCE 33-01-69-86-83-60www.keithley.frITALY 9www.keithle
2000 2008. HoW to cHoose And . Learn faster, work smarter, and invent easier with the Model 2450 Touchscreen SMU Instrument, . Series 2600B System SourceMeter instruments are designed for use as either bench-top I-V characterization tools or as building block components of multi-cha
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Harvard, returns to the School in January to relate his experiences and offer advice. Some boys plan to apply to the Sutton Trust US Summer School. A 23-strong cast, headed by Year 13’s Nicholas Pirabaharan in the title rôle, gave an abridged version of the famous history play at the ArtsDepot in North Finchley for
ISO 50001 SME can receive up to 80 % funding for an Energy Audit according to DIN 16247 Introduction to ISO 50002: How it fits into ISO 50001 family of standards [2] [1] Eva Hoos, ENER C3 Energy Efficiency Directorate-General for Energy European Commission [2] Introduction to ISO 50002: How it fits int
Art Research: Neil Ryder Hoos The text of this book is composed in Fairfield Medium with the display set in Bernhard Modem. Composition by Binghamton Valley Composition. Manufacturing by R. R. Donnelley & Sons, Inc. Library of Congress Cataloging-in-Publication Data The Norton anthology of American literature I Nina Bayrn, general editor.
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By G.E. Schwarz, A.B. Hoos, R.B. Alexander, and R.A. Smith Abstract SPARROW (SPAtially Referenced Regressions On Watershed attributes) is a watershed modeling technique for relating water-quality measurements made at a network of monitoring stations to
4-H Royalty Candidates.12 Supporting 4-H . erdeen,South Dakota, and additional mailing of-fices. USPS 003-240. Advertising Representative, Landon Associates, . Dacotah Stampede Rodeo Tuesday, August 12 Dacotah Stampede Rodeo Wednesday, August 13 Hairball with Judd Hoos
the transactions are difficult to discern. This makes it difficult to determine the overall size of activity and to know what the fair price is for a particular technology. And, of course, in highly inefficient markets a good deal of potentially valuable trade in innovation does not occur. The costs are so high and the potential value so difficult to perceive that innovation often sits “on .
