Grazing-angle Fourier Transform Infrared Spectroscopy For Surface .

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NAVAL FACILITIES ENGINEERING SERVICE CENTERPort Hueneme, California 93043-4370Technical ReportTR-2217-SHRGRAZING-ANGLE FOURIER TRANSFORMINFRARED SPECTROSCOPY FORSURFACE CLEANLINESS VERIFICATIONFinal ReportPlastic blast media residue on stripped C10 aircraft skin (aluminum)Clean aluminum aircraft skinFlle#1 ACRAFTI300025002000Wavenumber (cm-l)15001000byTheresa A. HoffardMarch 2003Approved for public release; distribution is unlimited.oPrinted on recycled paper

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Form ApprovedOMB No. 0704-0188REPORT DOCUMENTATION PAGEPublic reporting burden for this collection of information is estimated to average 1 hour per response, including the time for reviewing instructions, searching existingdata sources, gathering and maintaining the data needed, and completing and reviewing the collection of information. Send comments regarding this burden estimate orany other aspect of this collection of information, including suggestions for reducing this burden to: Washington Headquarters Services, Directorate for InformationOperations and Reports, 1215 Jefferson Davis Highway, Suite 1204, Arlington, VA 22202-4302, and to the Office of Management and Budget, Paperwork ReductionProject (0704-0188), Washington, DC 20503.1. AGENCY USE ONLY (Leave blank)2. REPORT DATE3. REPORT TYPE AND DATES COVEREDMarch 20034. TITLE AND SUBTITLEJanuary 2000 – December 20025. FUNDING NUMBERSGRAZING-ANGLE FOURIER TRANSFORM INFRAREDSPECTROSCOPY FOR SURFACE CLEANLINESS VERIFICATION –FINAL REPORT6. AUTHOR(S)Theresa A. Hoffard7. PERFORMING ORGANIZATION NAME(S) AND ADDRESS(ES)8.Commanding OfficerNaval Facilities Engineering Service Center1100 23rd AvePort Hueneme, CA 93043-4370PERFORMING ORGANIZATIONREPORT NUMBERTR-2217-SHR9. SPONSORING/MONITORING AGENCY NAME(S) AND ADDRESS(ES)10. SPONSORING/MONITORING AGENCYDepartment of DefenseStrategic Environmental Research and Development Program, Program Office901 North Stuart Street, Suite 303Arlington, VA 2220311. SUPPLEMENTARY NOTES12a. DISTRIBUTION/AVAILABILITY STATEMENT12b. DISTRIBUTION CODE13. ABSTRACT (Maximum 200 wordAs part of the Surface Cleanliness Verification project, sponsored by the Strategic Environmental Research andDevelopment Program, the Naval Facilities Engineering Service Center conducted an investigation of grazingangle reflectance Fourier Transform Infrared (FTIR) Spectroscopy as a tool for online cleanliness verification atDOD maintenance and repair facilities. In the project’s first year, the feasibility of grazing-angle reflectance FTIRwas demonstrated in the laboratory for the detection of organic contaminant residues on reflective surfaces. InYears 2 and 3, this technology was transitioned from the laboratory into a portable field device capable of detectingorganic and certain inorganic contaminants on reflective surfaces at very sensitive levels ( 1.0 µg/cm2). Examplesof DOD applications where surface cleanliness is critical include coating, plating and bonding of aircraft parts;bearing refurbishment; and shipboard surface tile mounting. Visual inspection and water break testing are ofteninadequate to detect contamination that may cause subsequent bonding or fouling problems if not removed.14. SUBJECT TERMSFTIR, Fourier transform, infrared, spectroscopy, grazing-angle, reflectance, surfacecontamination, cleaning verification, NFESC, cleanliness, residue, contaminants,portable17. SECURITY CLASSIFICATIONOF REPORTU18. SECURITY CLASSIFICATIONOF THIS PAGEU19. SECURITY CLASSIFICATIONOF ABSTRACTUNSN 7540-01-280-550015. NUMBER OF PAGES6016. PRICE CODE20. LIMITATION OF ABSTRACTUStandard Form 298 (Rev. 2-89) Prescribed by ANSI Std Z39-18 298-102iii

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EXECUTIVE SUMMARYAs part of the Surface Cleanliness Verification Project, the Naval Facilities EngineeringService Center (NFESC) conducted a study of grazing-angle reflectance Fourier TransformInfrared (FTIR) Spectroscopy as a tool for on line cleanliness verification at Department ofDefense (DOD) cleaning facilities. Examples of applications where surface cleanliness is criticalinclude coating, plating, and bonding of aircraft parts; bearing refurbishment, and shipboardsurface mounting of absorbing tiles. In cases such as these, visual inspection or water breaktesting are often inadequate to detect contamination that will cause subsequent bonding orfouling problems.NFESC partnered with Sandia National Laboratories, Livermore, California, under thesponsorship of the Strategic Environmental Research and Development Program (SERDP) in thedevelopment of two prototype instruments with complementary capabilities for cleaningverification. While Sandia conducted studies on an infrared laser-imaging device, NFESC ledthe effort to develop grazing-angle reflectance FTIR technology into a real-time, on-site devicefor post-cleaning determination of surface contamination. In the project’s first year, thefeasibility of grazing-angle reflectance FTIR was demonstrated in the laboratory for the detectionof organic contaminant residues on reflective surfaces. In the project’s second and third (final)years, this technology was transitioned from the laboratory into a portable field device capable ofdetecting organic and certain inorganic contaminants on reflective surfaces.Results of the study revealed that grazing-angle reflectance FTIR is a very sensitivemethod for detection of organic residues on metallic surfaces, capable of detecting contaminantsto 1.0 µg/cm2 with average baseline noise levels of 0.0005 reflectance-absorption units onreflective surfaces.Work during Year 2 of the project included continuation of measurements on calibratedcontaminants in the laboratory, designing and constructing the portable grazing-angle reflectancedevice, and collecting and analyzing DOD hardware samples on both the laboratory and portabledevices. During Year 3, the final year of the project, improvements were incorporated into theportable device, corresponding cleanliness verification software was written, and the device wassuccessfully field-demonstrated at selected DOD sites.v

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TABLE OF CONTENTSPage1.INTRODUCTION .12.BACKGROUND .13.EXPERIMENTAL PROCEDURES .44.RESULTS .10A.B.C.D.E.F.G.NFESC Laboratory Analysis of Contaminant D .10Analysis of Non-Metallic Composites .15Development of the Portable Grazing-Angle Reflectance FTIR .18Laboratory Specimens Analyzed by Portable FTIR Device .22Real-World Specimen – Comparison of Laboratory andPortable Devices .23Field Demonstrations of the Portable Grazing-Angle FTIR .33Economic Cost Analysis for the Portable Grazing-Angle FTIR .415.DISCUSSION AND CONCLUSIONS .456.ACKNOWLEDGEMENTS .487.REFERENCES .48APPENDIXA -Matrix of Calibrated Samples for Grazing-Angle Reflectance FTIR TestingYears 2-3 .49vii

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1.INTRODUCTIONAs part of the Surface Cleanliness Verification Project, the Naval Facilities EngineeringService Center (NFESC) conducted a study of grazing-angle reflectance Fourier TransformInfrared (FTIR) Spectroscopy as a portable tool for rapid cleanliness verification at Departmentof Defense (DOD) cleaning facilities.NFESC partnered with Sandia National Laboratories, Livermore, California, under thesponsorship of the Strategic Environmental Research and Development Program (SERDP) in thedevelopment of two prototype instruments with complementary capabilities for cleaningverification. While Sandia conducted studies on an infrared laser-imaging device, NFESC led theeffort to develop grazing-angle reflectance FTIR technology into a real-time, on-site device forpost-cleaning determination of surface contamination. Surface Optics Corporation (SOC) wasselected as the contractor to develop the device.Applications where surface cleanliness is critical include coating, plating, and bonding ofaircraft parts; bearing refurbishment; and shipboard surface mounting of absorbing tiles. In thesecases, visual inspection or water break testing are often inadequate to detect contamination thatwill cause subsequent bonding or fouling problems if not removed.In the project’s first year, the feasibility of grazing-angle reflectance FTIR wasdemonstrated in the laboratory for the detection of organic contaminant residues on reflectivesurfaces. During Years 2 and 3, a portable real-time prototype device was successfully designedand built. The device allows process operators to analyze parts on-site and make determinationsof subsequent cleaning actions, as well as distinguish between specific contaminants.The reader is invited to review NFESC Technical Memorandum TM-2335-SHR,Grazing-Angle Fourier Transform Infrared Spectroscopy for Online Surface CleanlinessVerification: Year 1, for detailed information on Year 1 laboratory studies (Ref 1).2.BACKGROUNDThe instrumental detection and identification of organic contaminants on reflectivesurfaces is conveniently and rapidly done by FTIR reflective methods. However, while FTIR isa mature analytical technique, commercially available instrument configurations have not beenwell suited for real-time analysis of low levels of surface contaminants ( 1.0 micrometer).Until recent developments in this project, portable infrared devices were limited in sensitivity tosurface contaminants by the nature of their optical designs.FTIR sampling techniques such as attenuated total reflectance (ATR) and diffusereflectance infrared Fourier transform spectroscopy (DRIFTS) have been commercialized intocompact hand-held designs. In these devices, infrared radiation contacts the surface to beanalyzed at angles of incidence of near-normal to 60 degrees from normal, resulting in limitedsensitivity to very thin layers of surface species.“Grazing-angle” sampling technology, on the other hand, allows the sensitivity ofinfrared reflectance measurements to be maximized for thin layers of organic materials onmetallic surfaces. As early as the late 1950’s, researchers have studied grazing-angle reflectanceinfrared spectroscopy (Ref 2 and 3). Non-portable, laboratory sampling devices employinggrazing-angle reflectance technology are commercially available. Until this joint SERDP project,the technology had not yet advanced to the commercialization of a portable, on-site, and realtime device.1

Grazing-angle reflectance theory can be explained by referring to Figure 1. In reflectionspectroscopy, a portion of the incident radiation beam (in this case infrared) reflects off thesurface of a thin film, while the remaining portion travels (is refracted) through the film andreflects off a reflective substrate back through the film. This is known as “double-pass”reflection-absorption (Refs 4 and 5)S- componentof electric vectorIncidentRadiationP- component ofelectric vector90 phase shift ofreflected P- componentReflectedRadiationΘd180 phase shift ofreflected S -componentThin film of thickness “ d”Reflective SubstrateΘ Angle of IncidenceFigure 1. Infrared energy striking a contaminated reflectivesubstrate at a grazing angle of incidence.Predominantly, improved sensitivity at grazing angles results from the polarizationphenomenon of electromagnetic radiation (Refs 6 and 7). The electric vector of allelectromagnetic radiation contains two components – the p-component and s-component. Forradiation contacting reflective surfaces, the s-component, perpendicular to the plane of reflection(parallel to the plane of the surface), undergoes a phase shift of approximately 180 degrees. Thevector sum of the incident and reflected s-component is almost zero at the surface; thus, the twocomponents cancel each other out. At grazing angles, the p-polarized component undergoes aphase shift at the surface from approximately 20 to 180 degrees, depending on the exact angle ofincidence. At large incident angles, this phase shift is approximately 90 degrees (Ref 7). Thevector sum of the incident and reflected p-component now give an intense electric field orientedperpendicular to the reflecting surface. When passed through a polarizing lens, the s-componentof the reflected radiation can be filtered out and only the p-component is detected and convertedto a spectrum.Additionally, at large angles of incidence, the infrared beam contacts the contaminant–laden surface at an increased effective path length through the infrared-absorbing material. Inaccordance with Beer’s Law of absorbance, this enhances the absorption, which results in astronger FTIR “signal” of the contaminant (Ref 8).2

FTIR employs infrared radiation to characterize and quantify organic (and a number ofinorganic) materials. At the molecular level, an organic substance absorbs infrared energy andundergoes vibrations at discrete frequencies, or wavelengths, according to its unique chemicalmakeup. A graph of the energy absorbed versus the infrared frequency in “wavenumbers”(inversely proportional to wavelength) is called the “spectrum” of that material. Unique chemicalfunctional groups produce distinct absorption patterns. For a pure compound, the spectrumbecomes a fingerprint of identification. For unknown materials or mixtures such as paints, aspectrum may classify the material as being from a particular chemical family, e.g., a urethane orepoxy. However, it may not always provide enough information to identify the components.Figure 2 shows a typical reflectance-absorbance FTIR spectrum. The “peaks” or “bands”represent infrared light absorbed by the chemical species being analyzed. The two spectrarepresent a very thin film of electrically insulating grease on an aluminum substrate analyzed at 0and 75 degrees (grazing-angle), respectively. The absorbance of the infrared energy in thematerial is dramatically enhanced at 75 degrees. In the enhanced spectrum, the location andshape of the peaks allow an FTIR analyst to easily classify this material as a silicone.4.35.375 Log (1/R).25.2.15.1.05030 -.053500300025002000Wavenumber (cm-1)15001000Figure 2. Comparison of a 0.2 µm silicone film on aluminumanalyzed at 30 and 75 .3

3.EXPERIMENTAL PROCEDURESBased on results obtained during Year 1, NFESC continued its laboratory experiments onmore materials and select “real-world” specimens received from military depots. Theselaboratory results were then compared to results obtained on the newly developed portablesystem. The portable system was additionally tested with commercially prepared specimens fromthe Boeing Corporation. Field demonstrations were conducted with the portable device at twomilitary sites. Based on the results of that demonstration, modifications and upgrades wereperformed on the system, as well as the development of software specifically designed forcleanliness verification studies. The portable system was taken back to the demonstration site fora second, follow-up test of its new capabilities.Laboratory analysis was performed on NFESC’s Biorad FTS-60 research-grade FTIRutilizing a standard DTGS room-temperature detector. Corresponding background spectra werecollected using clean metal substrates at roughness values matching those of the contaminatedsamples. Background spectra are used to ratio sample and reference “single beam” scans andconvert them to reflectance-absorption spectra.The grazing-angle sampling device used in the laboratory FTIR is commerciallyavailable. It is designed for installation inside the sample compartment of a laboratory FTIR, i.e.,non-portable operation (Figure 3). This interface is a variable-angle device, allowing analysis ofa variety of reflective parts at incident radiation angles of 30 to 80 degrees.Figure 3. FTIR with variable-angle sampling device.Appendix A lists all of the test specimens prepared during Years 2 and 3. During Year 1,three contaminants were selected for laboratory examination. During Years 2 and 3, threeadditional contaminants were tested in the laboratory. The first three contaminants from Year 1,along with these additional contaminants, were used to prepare coupons for testing the portableFTIR device. All contaminants were selected based on feedback from selected military depotinstallations and DOD contractor facilities. The contaminants are commercially availableproducts used at these facilities. The metal substrates were also chosen based on usage data4

obtained from military and contractor facilities. Table 1 shows the contaminants and metalsubstrates utilized during Years 2 and 3.Table 1. Years 2 & 3 Laboratory Contaminants and SubstratesMaterialDesignationDescriptionAWhite soft solid ester greaseBBrown liquid – paraffin hydrocarbonsCSemi-transparent silicone greaseDGreen liquid containing vinyl polymersENorth Island Naval Aviation Depot(NADEP) prepared mixture ofhydrocarbons and polyol estersHill Air Force Base plastic blast media –methyl methacrylate polymer1.5” x 5” test panels prepared bycommercial vendor at selectedroughness values1.5” x 5” test panels prepared bycommercial vendor at selectedroughness values1.5” x 5” test panels prepared bycommercial vendor at selectedroughness values1.5” x 5” test panels prepared bycommercial vendor at selectedroughness valuesEtched and deoxidized panels providedby North Island NADEPEtched and deoxidized panels providedby North Island NADEPChromate conversion coated panelsprovided by North Island NADEPChromate conversion coated panelsprovided by North Island NADEPSulfuric acid anodized panels providedby North Island NADEPChromic acid anodized panels providedby Hill AFB, already contaminatedDichromate conversion coated panelsprovided by Hill AFBFAluminum 7075-T6Titanium-4Al-6VStainless Steel 304Steel-C4340Aluminum 7075Aluminum 2024Aluminum 7075Aluminum 2024Aluminum 2024Aluminum 7075Aluminum 70755TypicalUsageMetal drawing, cuttingand lubricating agentRust preventative,cleaner, lubricant,protectant for metalsElectrically insulatingcompound, lubricantMold-release agentIndividual componentsused as aircraft engineoil, hydraulic fluid,lubricating greasesRemoval of coatingsfrom metal surfacesAircraft component andframing materialAerospace componentsAerospace componentsHigh heat applications inaircraft, landing gearsAircraft componentsAircraft componentsAircraft componentsAircraft componentsAircraft componentsAircraft componentsAircraft components

Three surface roughness finishes of commercially milled aluminum test coupons wereselected: 80-, 220-, and 600-grit (600-grit being the smoothest). Grit refers to the sandpaper orabrasive blast used by the vendor to create the surface profiles. Two surface roughness levels,600- and 220-grit, were selected for the remaining commercial metal types. Values were selectedas a result of feedback from potential FTIR users at DOD and contractor fabrication and repairfacilities. Figure 4 shows varying roughness levels of the aluminum. Figure 5 shows all of themetal types tested.Figure 4. Aluminum surface roughnessvalues 600-, 220-, 80-grit (from left to right).Figure 5. Aluminum, titanium, stainlesssteel, and steel alloy(from left to right, all at 600-grit).A profilometer was used to examine the surface roughness profiles and provide “Ra”values (in micrometers or micro-inches) of the commercially obtained coupons. Ra roughness,the arithmetic average roughness, is a term used for machined surfaces. It represents thearithmetic average of the absolute deviations from the mean surface level.The average surface roughness of aluminum used for aircraft skin is typically required tobe 125 micro-inch (3.175 µm). These metal panels are either sheet metal as-is (rolled,chemically milled, machined), or they are abrasively cleaned by grit blast or sand paper.Due to the nature of metal shop finishing processes, surface roughness values can varyconsiderably across a given surface area. The metal surfaces of the coupons, upon finishing atthe vendor’s facility, acquired a directional “grain” parallel to the coupons’ longitudinal axis.Figure 6 shows the variation in surface roughness for the aluminum panels and the relationshipto grit finishes. The profilometer data reveal that Ra differences for longitudinal orientation arenot as extreme as the differences for transverse orientation.6

Surface Roughness - Longitudinal & TransverseAl-7075-T6 PanelsMeasured by Profilometer7.0Measurement (um)Ra - Average .080 Grit120 Grit220 Grit320 Grit400 Grit600 GritSurface FinishFigure 6. Ra values related to surface finish of test panels.Except for the panels received from Hill Air Force Base (which were analyzed asreceived), all panel coupons where prepared in the laboratory at NFESC, being washed withacetone and cleaned by sonication with a clean-rinsing aqueous cleaner prior to contaminantapplication. They were thoroughly rinsed and allowed to dry in a desiccator or oven after blottingand air drying. Once dry, they were weighed on a semi-microbalance to the nearest 0.01 mg.Two or more weighings over the course of 2 to 3 days were averaged. No evidence of rustingwas seen on the surfaces of the steel C4340 panels that were dried promptly after cleaning.Contaminants were applied by dilution in appropriate solvents and manual brushing ontothe panels (Figure 7). Contaminant D, for example, was diluted in a mixture of water andisopropyl alcohol. Water-only dilutions were found to result in poor wetting of the metalsubstrates. Alcohol-only dilutions resulted in formation of a solid precipitate from ContaminantD. The combination of water and isopropyl alcohol provided sufficient solvating properties forContaminant D and adequate wetting of the substrate.The amount of contaminant applied onto the substrate surfaces was varied bysystematically altering the contaminant-to-solvent ratios. The uniformity of the films applied tothe substrate test samples varied with physical properties of the contaminants and substrates.Once contaminated, the panels were allowed to dry under a fume hood to evaporate thesolvent. They were then placed in a desiccator for final drying. This served to stabilize thecontaminants, allowing for quantification of the contamination film by weighing. Once theweights became stable, final weight averages were recorded. When not being analyzed, thesamples were kept in the desiccator.7

Figure 7. Contaminant being applied to analuminum panel by manual brushing.The test coupons were analyzed at NFESC with the laboratory FTIR and grazing-anglereflectance sampling device (Figure 8). Spectra were collected at a 75-degree angle of incidencefor all of the specimens, and also at 60 degrees for selected samples. Theoretically, incidentangles of 80 to 85 degrees provide the greatest enhancement of the reflectance-absorption signalfor metal substrates. However, the configuration of a particular instrument and sampling deviceoptics, as well as the characteristics of the sample may dictate using a smaller angle. It wasdetermined during Year 1 that setting the particular laboratory-sampling device to 80 degreeswas increasing baseline noise without significantly enhancing the peak intensities in proportionto the noise. Thus, 75-degree measurements were taken instead of 80- degree measurements.Figure 8. Coupon being placedlongitudinally onto sampling device.n portable device and theSelected test panels were then sent to SOC for analysis on thedata was compared to data from the non-portable laboratory device. The portable device wasdesigned with a fixed angle of incidence at 75 degrees.To examine the effect of non-flat sample geometries on the grazing-angle method, sixflexible aluminum strips were cleaned, contaminated, and wrapped around 1-cm radius cylinders.These flexible panels were weighed before and after application of Contaminant D. Three of the8

strips were roughened with 220-grit sandpaper before the other preparation steps. The remainingstrips had a finish that approximating the 600-grit flat aluminum panels. The cylindrical stripswere analyzed at NFESC in the same manner as the flat panels (Figure 9).Figure 9. Cylinder being analyzed in a longitudinal orientation.All test coupons were analyzed using a polarizer in the reflectance device, bothlaboratory and portable. Figure 10 shows the C-H stretching spectral region of a hydrocarboncontaminant on a vapor-degreased aluminum panel analyzed at 75 degrees with s-polarization,no polarization, and p-polarization of the reflected radiation, respectively. The spectral peaks areenhanced significantly with p-polarization.04p-polarizedAbsorbanceLog [1/R].03.02.01No venumber (cm-1)27002600Figure 10. Spectra of a hydrocarbon on vapor degreasedaluminum showing the effects of polarization.Spectral peak area integration calculations were performed by NFESC.9

4.RESULTSA.NFESC Laboratory Analysis of Contaminant DNFESC TM-2335-SHR contains details of laboratory testing of Contaminants “A”, “B”,and “C” on various metal substrates during Year 1 of the project, and the information will not berepeated here. The laboratory analysis of Contaminant D is presented below.Figure 11 shows a grazing-angle reflectance spectrum of Contaminant D on an aluminumtest coupon (600-grit). For the FTIR analyst, accurate interpretation of the peaks andclassification of this film as a vinyl polymer is straightforward because the grazing anglespectrum obtained is intense and clear, even at a film thickness level of 1 µm. In contrast, otherFTIR methods such as diffuse reflectance or specular reflectance would produce much lessintense spectra at this level, making it more difficult to accurately classify or quantify the surfacecontaminant.Figure 11. Spectrum of Contaminant D on aluminum coupon ( 1.0 µm).In reflectance FTIR, the log of the inverse-reflectance represents the absorbance of IRenergy by the contaminant at various frequencies or wavelengths of infrared light. Selected peakheights or areas under the peaks are linearly proportional to film concentration on the substratesurface. A film concentration level is determined by weighing the substrate coupon before andafter application and drying of the contaminant, and dividing the difference by the known area ofthe coupons. To convert this concentration value to a film thickness value, the concentrationvalue is divided by the specific gravity of the dried contaminant (as determined in the10

laboratory). By calculating the film thickness in this manner, an assumption is made that thecontaminant is covering the entire surface of the substrate.Area integration curves of the spectral “carbonyl” peak at 1735 cm-1 for three surfaceroughness values are presented in Figures 12. The integrated areas are plotted against filmthickness (calculated as described above). Therefore, each point represents a separate samplecoupon.A surprising degree of non-linearity was observed for the smoothest aluminum coupons,while the 220- and 80-grit panels produced more predictable results. The 600-grit coupons wereexpected to yield good linearity, and greater peak intensity, since the contaminant is similar in itsphysical properties to Contaminant B (analyzed during the first year of the project). Both areliquids, soluble in selected solvents, and easy to apply to the metal substrates. It may be that thesmoothest surface resulted in the Contaminant D film being distributed less evenly across thesurface in contrast to application on the rougher panels. Selected coupons were analyzed atdifferent locations along their lengths and averaged to check for film uniformity. In Figure 12 thevertical error bars indicate similar amounts of variation were observed for the three surfaceroughness profiles.P a r t a ll F ilm o n A l-7 0 7 5 ( L o n g itu d in a l / M a s k / 7 5 )D a t a P o in t s w ith E rro r B a r s R e f l e c t A v e r a g e A r e a s f r o m S c a n s a t T h r e e P o s itio n s( B a r s R e f l e c t S t a n d a r d D e v iation Value s )12Area of 1735 cm-1 Peak from log[1/R] spectra1086 0 0 G rit A l2 2 0 G rit A l68 0 G rit A l42000.20.40.60.811.21.41.61.822.22.4F i l m T h i c k n e ss (u m )Figure 12. Integrated peak areas of the 1735 cm-1 peak in the FTIRreflectance spectra of aluminum panels contaminated with Contaminant Das a function of surface roughness.Figure 13 shows calibration curves calculated for Contaminant D on metal substratesother than aluminum. As in Figure 12, the peak area of the carbonyl peak (representing theabsorbance level of the contaminant proportional to amount of contaminant present) is plottedagainst the calculated film thickness values. These curves can then be used to quantify thecontamination on specimens with unknown levels.11

Steel C4340 220 grit panelswith Contaminant DSteel C4340 600 grit panelswith Contaminant D25252020151560o101060o575o75o50000.511.502Film Thickness (um)11.52Film Thickness (um)Stainless-304 220 grit panelswith Contaminant DStainless-304 600 grit panelswith Contaminant D200.520151560o1060o1075o575o50000.40.81.21.6020.

infrared reflectance measurements to be maximized for thin layers of organic materials on metallic surfaces. As early as the late 1950's, researchers have studied grazing-angle reflectance infrared spectroscopy (Ref 2 and 3). Non-portable, laboratory sampling devices employing grazing-angle reflectance technology are commercially available.

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