CERTIFICATE OF ACCREDITATION - Martin Calibration
CERTIFICATE OF ACCREDITATIONANSI National Accreditation Board11617 Coldwater Road, Fort Wayne, IN 46845 USAThis is to certify thatMartin Calibration, Inc.11965 12th Avenue SouthBurnsville, MN 55337Including satellite locations located in: Mundelein, IL, Watertown, SD, and Eau Claire, WIhas been assessed by ANAB and meets the requirements of international standardISO/IEC 17025:2017and national standardANSI/NCSL Z540-1-1994 (R2002)while demonstrating technical competence in the fields ofCALIBRATION & DIMENSIONAL MEASUREMENTRefer to the accompanying Scope of Accreditation for information regarding the types ofactivities to which this accreditation appliesACT-1265Certificate NumberCertificate Valid Through: 07/06/2020Version No. 008Issued: 12/11/2019This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017.This accreditation demonstrates technical competence for a defined scope and the operation of a laboratoryquality management system (refer to joint ISO-ILAC-IAF Communiqué dated April 2017).
SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017AND ANSI/NCSL Z540-1-1994 (R2002)Martin Calibration, Inc.11965 12th Avenue SouthBurnsville, MN 55337Corey Garbers952-882-1528CALIBRATION AND DIMENSIONAL MEASUREMENTValid to: July 6, 2020Certificate Number: ACT-1265CALIBRATIONAcoustics and VibrationParameter/EquipmentRangeExpanded Uncertainty ofMeasurement ( /-)Sound Level – Fixed Points(94, 104, 114) dB0.2 dBSound Level - Linearity(50 to 143) dB0.13 dBSound Level - Frequency(0.031 to 16) kHz1 % of readingSound Level - DistortionAccelerometersVersion 008(25 to 123) dB(0.031 to 16) kHz(5 to 9) Hz(10 to 99) Hz100 Hz(101 to 920) Hz921 Hz to 5 kHz(5 to 8) kHz(8 to 10) kHz(10 to 15) kHzIssued: December 11, 20190.14 dB2.6 % of reading1.6 % of reading0.75 % of reading1.3 % of reading2.2 % of reading3.8 % of reading4.8 % of reading8.6 % of readingwww.anab.orgPage 1 of 62Reference Standard,Method, and/orEquipmentBruel & Kjaer SoundPressure CalibratorPCB Shaker Table withPCB ReferenceAccelerometer
Chemical QuantitiesReference Standard,Method, and/orEquipmentRangeExpanded Uncertainty ofMeasurement ( /-)(0.86 to 10) µS/cm(10 to 100) µS/cm(100 to 1 500) µS/cm12 800 µS/cm0.00 Brix10.00 Brix40.00 Brix0.42 µS/cm0.89 µS/cm0.42 % of reading0.42 % of reading0.000 6 Brix0.018 Brix0.019 Brix70.00 Brix0.03 Brix4 pH7 pH10 pH0.072 pH0.023 pH0.18 pHBuffer SolutionsParameter/EquipmentRangeExpanded Uncertainty ofMeasurement ( /-)Reference Standard,Method, and/orEquipmentDC Voltage - Source1Fixed Point10V0.5 µV/V732B Voltage Standardswith Fluke Maps0VUp to 1 mV(1 to 10) mV(10 to 100) mV(100 mV to 1) V(1 to 10) V(10 to 100) V(100 to 1 100) V0VUp to 1 mV(1 to 10) mV(10 to 100) mV(100 mV to 1) V(1 to 10) V(10 to 100) V(100 to 1 100) V(1.1 to 10) kV(10 to 30) kV(30 to 50) kV(50 to 70) kV(70 to 100) kV20 nV100 nV22 µV/V 25 nV5.3 µV/V0.5 µV/V0.31 µV/V0.35 µV/V1 µV/V20 nV100 nV22 µV/V 25 nV5.3 µV/V0.5 µV/V0.31 µV/V0.35 µV/V1 µV/V0.05 % of reading0.055 % of reading0.079 % of reading0.12 % of reading0.83 % of readingParameter/EquipmentConductivity Meters1Refractometers1pH MetersConductivity StandardsCalibration SolutionsElectrical – DC/Low FrequencyDC Voltage - Source1DC Voltage - Measure1DC High Voltage - Measure1Version 008Issued: December 11, 2019www.anab.orgPage 2 of 62MI Potentiometer/ Divider& Fluke 5720A MultiProduct CalibratorNano VoltmeterFluke 732BVoltageStandard with MIPotentiometer/ DividerHipotronics KVM100-AHigh Voltage Meter
Electrical – DC/Low FrequencyRangeExpanded Uncertainty ofMeasurement ( /-)0A(0 to 200) pA(0.2 to 20) nA(20 to 100) nA(0.1 to 1) µA(1 to 10) µA(10 to 100) µA(0.1 to 1) mA(1 to 10) mA(10 to 100) mA(0.1 to 1) A(1 to 20) A(20 to 120) A76 fA1.9 % of reading 10 fA0.29 % of reading 1 pA8 µA/A 1.3 pA30 µA/A6.8 µA/A6.2 µA/A4.1 µA/A4.2 µA/A3.9 µA/A17 µA/A26 µA/A80 µA/A 4 mA(100 to 150) A(150 to 1 025) A5 mA/A 20 mA5.1 mA/A 0.9 A10.9 µW to 10.9 mW10.9 mW to 3.06 kW0.18 mW/W0.17 mW/W(3.06 to 20.9) kW0.54 mW/W109 µW to 1.09 mW(1.09 to 297) µW297 µW to 2.97 mW2.97 mW to 337 W337 W to 2.24 kW1.1 mW/W930 µW/W780 µW/W620 µW/W700 µW/W(2.24 to 20.9) kW780 µW/WParameter/EquipmentDC Current – Source &Measure1DC Current – Source &Measure1DC Current – Source &Measure1DC Current - Source1DC Power – SourceAC Power – Source(45 to 65) HzAC Voltage –Source & Measure1Version 008(0 to 2.2) mV(10 to 20) Hz(20 to 40) Hz(0.04 to 20) kHz(20 to 50) kHz(50 to 100) kHz(100 to 300) kHz(300 to 500) kHz(0.5 to 1) MHzIssued: December 11, 20191.1 mV/V 1.3 µV490 µV/V 1.3 µV280 µV/V 1.3 µV540 µV/V 2 µV800 µV/V 2.5 µV1.5 mV/V 4 µV1.6 mV/V 8 µV2.3 mV/V 8 µVwww.anab.orgPage 3 of 62Reference Standard,Method, and/orEquipmentElectrometerStandard resistors andDMM and MultifunctionCalibratorFluke 52120A Amplifierwith shuntsFluke 5520A Multi ProductCalibrator with 50-turnCoilFluke 5520A Multi ProductCalibratorFluke 5520A Multi ProductCalibratorFluke 5790A AC Standardw/ 5720A Multi ProductCalibrator
Electrical – DC/Low FrequencyParameter/EquipmentAC Voltage –Source & Measure1Version 008RangeExpanded Uncertainty ofMeasurement ( /-)(2.2 to 7) mV(10 to 20) Hz(20 to 40) Hz(0.04 to 20) kHz(20 to 50) kHz(50 to 100) kHz(100 to 300) kHz(300 to 500) kHz(0.5 to 1) MHz(7 to 22) mV(10 to 20) Hz(20 to 40) Hz(0.04 to 20) kHz(20 to 50) kHz(50 to 100) kHz(100 to 300) kHz(300 to 500) kHz(0.5 to 1) MHz(22 to 70) mV(10 to 20) Hz(20 to 40) Hz(0.04 to 20) kHz(20 to 50) kHz(50 to 100) kHz(100 to 300) kHz(300 to 500) kHz(0.5 to 1) MHz(70 to 220) mV(10 to 20) Hz(20 to 40) Hz(0.04 to 20) kHz(20 to 50) kHz(50 to 100) kHz(100 to 300) kHz(300 to 500) kHz(0.5 to 1) MHzIssued: December 11, 2019Reference Standard,Method, and/orEquipment570 µV/V 1.3 µV250 µV/V 1.3 µV140 µV/V 1.3 µV270 µV/V 2 µV400 µV/V 2.5 µV800 µV/V 4 µV870 µV/V 8 µV1.5 mV/V 8 µV190 µV/V 1.3 µV130 µV/V 1.3 µV73 µV/V 1.3 µV140 µV/V 2 µV210 µV/V 2.5 µV540 µV/V 4 µV590 µV/V 8 µV1.1 mV/V 8 µV160 µV/V 1.5 µV80 µV/V 1.5 µV43 µV/V 1.5 µV87 µV/V 2 µV170 µV/V 2.5 µV340 µV/V 4 µV450 µV/V 8 µV730 µV/V 8 µV140 µV/V 1.5 µV57 µV/V 1.5 µV25 µV/V 1.5 µV46 µV/V 2 µV110 µV/V 2.5 µV170 µV/V 4 µV250 µV/V 8 µV670 µV/V 8 µVwww.anab.orgPage 4 of 62Fluke 5790A AC Standardw/ 5720A Multi ProductCalibrator
Electrical – DC/Low FrequencyParameter/EquipmentAC Voltage –Source & Measure1Version 008RangeExpanded Uncertainty ofMeasurement ( /-)(220 to 700) mV(10 to 20) Hz(20 to 40) Hz(0.04 to 20) kHz(20 to 50) kHz(50 to 100) kHz(100 to 300) kHz(300 to 500) kHz(0.5 to 1) MHz(0.7 to 2.2) V(10 to 20) Hz(20 to 40) Hz(0.04 to 20) kHz(20 to 50) kHz(50 to 100) kHz(100 to 300) kHz(300 to 500) kHz(0.5 to 1) MHz(2.2 to 7) V(10 to 20) Hz(20 to 40) Hz(0.04 to 20) kHz(20 to 50) kHz(50 to 100) kHz(100 to 300) kHz(300 to 500) kHz(0.5 to 1) MHz(7 to 22) V(10 to 20) Hz(20 to 40) Hz(0.04 to 20) kHz(20 to 50) kHz(50 to 100) kHz(100 to 300) kHz(300 to 500) kHz500kHz to 1MHzIssued: December 11, 2019Reference Standard,Method, and/orEquipment140 µV/V 1.5 µV51 µV/V 1.5 µV22 µV/V 1.5 µV34 µV/V 2 µV53 µV/V 2.5 µV120 µV/V 4 µV200 µV/V 8 µV640 µV/V 8 µV130 µV/V44 µV/V16 µV/V31 µV/V47 µV/V110 µV/V170 µV/V600 µV/V130 µV/V45 µV/V16 µV/V32 µV/V54 µV/V130 µV/V270 µV/V800 µV/V130 µV/V45 µV/V18 µV/V32 µV/V54 µV/V130 µV/V270 µV/V800 µV/Vwww.anab.orgPage 5 of 62Fluke 5790A AC Standardw/ 5720A Multi ProductCalibrator
Electrical – DC/Low FrequencyParameter/EquipmentAC Voltage –Source & MeasureAC Voltage –Source & MeasureFlatness relative to 1 kHzVersion 008Range(22 to 70) V(10 to 20) Hz(20 to 40) Hz(0.04 to 20) kHz(20 to 50) kHz(50 to 100) kHz(100 to 300) kHz(300 to 500) kHz500kHz to 1MHz(70 to 220) V(10 to 20) Hz(20 to 40) Hz(0.04 to 20) kHz(20 to 50) kHz(50 to 100) kHz(100 to 300) kHz(300 to 500) kHz(220 to 700) V(10 to 20) Hz(20 to 40) Hz(0.04 to 20) kHz(20 to 50) kHz(50 to 100) kHz(0 to 2.2) mV(10 to 30) Hz(30 to 120) Hz(0.12 to 1.2) kHz(1.2 to 120) kHz(120 to 500) kHz(0.5 to 1.2) MHz(1.2 to 2) MHz(2 to 10) MHz(10 to 20) MHz(20 to 30) MHzIssued: December 11, 2019Expanded Uncertainty ofMeasurement ( /-)Reference Standard,Method, and/orEquipment130 µV/V45 µV/V21 µV/V38 µV/V63 µV/V130 µV/V270 µV/V800 µV/V130 µV/V45 µV/V21 µV/V46 µV/V65 µV/V140 µV/V330 µV/VFluke 5790A AC Standardw/ 5720A Multi ProductCalibrator130 µV/V66 µV/V27 µV/V87 µV/V330 µV/V0.1 % of reading 1.3 µV0.05 % of reading 1.3 µV0.05 % of reading 1.3 µV0.05 % of reading 2.0 µV0.07 % of reading 1 µV0.07 % of reading 1 µV0.07 % of reading 1 µV0.17 % of reading 1 µV0.32 % of reading 1 µV0.7 % of reading 2 µVwww.anab.orgPage 6 of 62Fluke 5790A AC Standardw/ 5720A Multi ProductCalibrator(Wideband)
Electrical – DC/Low FrequencyParameter/EquipmentAC Voltage –Source & MeasureFlatness relative to 1 kHzVersion 008Range(2.2 to 7) mV(10 to 30) Hz(30 to 120) Hz(0.12 to 1.2) kHz(1.2 to 120) kHz(120 to 500) kHz(0.5 to 1.2) MHz(1.2 to 2) MHz(2 to 10) MHz(10 to 20) MHz(20 to 30) MHz(7 to 22) mV(10 to 30) Hz(30 to 120) Hz(0.12 to 1.2) kHz(1.2 to 120) kHz(120 to 500) kHz(0.5 to 1.2) MHz(1.2 to 2) MHz(2 to 10) MHz(10 to 20) MHz(20 to 30) MHz(22 to 70) mV(10 to 30) Hz(30 to 120) Hz(0.12 to 1.2) kHz(1.2 to 120) kHz(120 to 500) kHz(0.5 to 1.2) MHz(1.2 to 2) MHz(2 to 10) MHz(10 to 20) MHz(20 to 30) MHzIssued: December 11, 2019Expanded Uncertainty ofMeasurement ( /-)Reference Standard,Method, and/orEquipment0.1 % of reading0.05 % of reading0.05 % of reading0.05 % of reading0.07 % of reading 1 µV0.07 % of reading 1 µV0.07 % of reading 1 µV0.1 % of reading 1 µV0.17 % of reading 1 µV0.37 % of reading 1 µV0.1 % of reading0.05 % of reading0.05 % of reading0.05 % of reading0.07 % of reading0.07 % of reading0.07 % of reading0.1 % of reading0.17 % of reading0.37 % of reading0.1 % of reading0.05 % of reading %0.05 % of reading0.05 % of reading0.05 % of reading0.05 % of reading0.05 %% of reading0.1 % of reading0.15 % of reading0.35 % of readingwww.anab.orgPage 7 of 62Fluke 5790A AC Standardw/ 5720A Multi ProductCalibrator(Wideband)
Electrical – DC/Low FrequencyParameter/EquipmentAC Voltage –Source & MeasureFlatness relative to 1 kHzVersion 008RangeExpanded Uncertainty ofMeasurement ( /-)(70 to 220) mV(10 to 30) Hz(30 to 120) Hz(0.12 to 1.2) kHz(1.2 to 120) kHz(120 to 500) kHz(0.5 to 1.2) MHz(1.2 to 2) MHz(2 to 10) MHz(10 to 20) MHz(20 to 30) MHz(220 to 700) mV(10 to 30) Hz(30 to 120) Hz(0.12 to 1.2) kHz(1.2 to 120) kHz(120 to 500) kHz(0.5 to 1.2) MHz(1.2 to 2) MHz(2 to 10) MHz(10 to 20) MHz(20 to 30) MHz(0.7 to 2.2) V(10 to 30) Hz(30 to 120) Hz(0.12 to 1.2) kHz(1.2 to 120) kHz(120 to 500) kHz(0.5 to 1.2) MHz(1.2 to 2) MHz(2 to 10) MHz(10 to 20) MHz(20 to 30) MHzIssued: December 11, 2019Reference Standard,Method, and/orEquipment0.1 % of reading0.04 % of reading0.04 % of reading0.04 % of reading0.04 % of reading0.05 % of reading0.05 % of reading0.1 % of reading0.15 % of reading0.35 % of reading0.1 % of reading0.03 % of reading0.03 % of reading0.03 % of reading0.03 % of reading0.05 % of reading0.05 % of reading0.1 % of reading0.15 % of reading0.35 % of reading0.1 % of reading0.03 % of reading0.03 % of reading0.03 % of reading0.03 % of reading0.05 % of reading0.05 % of reading0.1 % of reading0.15 % of reading0.35 % of readingwww.anab.orgPage 8 of 62Fluke 5790A AC Standardw/ 5720A Multi ProductCalibrator(Wideband)
Electrical – DC/Low FrequencyParameter/EquipmentAC Voltage –Source & MeasureFlatness relative to 1 kHzAC Current – Source1AC Current – Source1AC Current – Measure1AC Current - Measure1Version 008RangeExpanded Uncertainty ofMeasurement ( /-)(2.2 to 7) V(10 to 30) Hz(30 to 120) Hz(0.12 to 1.2) kHz(1.2 to 120) kHz(120 to 500) kHz(0.5 to 1.2) MHz(1.2 to 2) MHz(2 to 10) MHz(10 to 20) MHz(20 to 30) MHzUp to 1 mADC to 10 kHz1 mA to 1 ADC to 10 kHz(1 to 20) ADC to 10 kHz(20 to 120) ADC to 1 kHz(1 to 6) kHzUp to 1 mA(DC to 30) kHz(30 to 100) kHz1mA to 1A(DC to 100) kHz(1 to 20) A(DC to 10) kHz(10 to 30) kHz(30 to 100) kHzUp to 200 µA(1 to 10) Hz10 Hz to 10 kHz(10 to 30) kHz(30 to 100) kHz200 µA to 2 mA(1 to 10) Hz10 Hz to 10 kHz(10 to 30) kHz(30 to 100) kHzIssued: December 11, 20190.1 % of reading0.03 % of reading0.03 % of reading0.03 % of reading0.03 % of reading0.05 % of reading0.05 % of reading0.1 % of reading0.15 % of reading0.35 % of readingReference Standard,Method, and/orEquipmentFluke 5790A AC Standardw/ 5720A Multi ProductCalibrator(Wideband)75 µA/A28 µA/AFluke 5720A Multi ProductCalibrator w/ A40B Shunts52 µA/A3 mA/A12 mA/AFluke 5720A Multi ProductCalibrator w/ A40B Shunts90 µA/A0.18 mA/A35 µA/AFluke A40B Shunts61 µA/A83 µA/A0.13 mA/A0.62 mA/A0.54 mA/A0.94 mA/A8.4 mA/A0.6 mA/A0.54 mA/A0.94 mA/A4.2 mA/Awww.anab.orgPage 9 of 62Fluke 8508A Multimeter
Electrical – DC/Low FrequencyParameter/EquipmentAC Current - Measure1Resistance - Source1Resistance - Measure1Version 008RangeExpanded Uncertainty ofMeasurement ( /-)(2 to 20) mA(1 to 10) Hz10 Hz to 10 kHz(10 to 30) kHz(30 to 100) kHz(20 to 200) mA(1 to 10) Hz10 Hz to 10 kHz(10 to 30) kHz200 mA to 2 A10 Hz to 2 kHz(2 to 10) kHz(10 to 30) kHz(2 to 20) A10 Hz to 2 kHz(2 to 10) kHz0.001 Ω0.01Ω0.1 Ω1Ω10Ω100 Ω1 kΩ10 kΩ100 kΩ1 MΩ10 MΩ100 MΩ1 GΩ(1 to 10) GΩ(10 to 100) GΩ(100 to 900) GΩ1 TΩ10 TΩ(10 to 100) µΩ(0.1 to 1) mΩ(1 to 10) mΩ(10 o 100) mΩ(0.1 to 1) Ω(1 to 10) Ω(10 to 100) ΩIssued: December 11, 2019Reference Standard,Method, and/orEquipment0.6 mA/A0.54 mA/A0.94 mA/A4.2 mA/A0.57 mA/A0.49 mA/A0.83 mA/AFluke 8508A Multimeter0.83 mA/A0.93 mA/A3.2 mA/A1 mA/A2.7 mA/A3.5 µΩ/Ω4.3 µΩ/Ω1.5 µΩ/Ω0.67 µΩ/Ω0.56 µΩ/Ω0.68 µΩ/Ω0.51 µΩ/Ω0.8 µΩ/Ω0.57 µΩ/Ω1.3 µΩ/Ω Ω14 µΩ/Ω130 µΩ/Ω26 µΩ/Ω0.16 % of reading0.54 % of reading0.56 % of reading1.6 % of reading1.7 % of reading0.15 % of reading15 µΩ/Ω5.1 µΩ/Ω1.8 µΩ/Ω0.67 µΩ/Ω0.56 µΩ/Ω0.68 µΩ/Ωwww.anab.orgPage 10 of 62Standard resistorsStandard resistors withbridge and DMM
Electrical – DC/Low FrequencyParameter/EquipmentResistance - Measure1Resistance - Measure1Resistance - Measure1High Voltage Modeup to 200 VAC Resistance(Impedance)Capacitance - Measure1Capacitance - Source1(fixed values)@ 100 Hz@ 1 kHz(0.1 to 1) kΩ(1 to 10) kΩ(10 o 100) kΩ(0.1 to 1) MΩ(1 to 10) MΩ(10 to 200) MΩ(0.2 to 2) GΩ(2 to 20) GΩ(2 to 20) MΩ(20 to 200) MΩ200 MΩ to 2 GΩ(2 to 20) GΩ(1, 500) kHz, 1 MHz25 Ω375 Ω(1, 250, 500) kHz, 1 MHz6 kΩ(1, 25, 50) kHz100 kΩ1 pF @ 1 kHz10 pF @ 1 kHz100 pF @ 1kHz1 nF 1kHz1 µF @ 1 kHz1 pF1 nF10 nF100 nF1 µF0.51 µΩ/Ω0.8 µΩ/Ω0.57 µΩ/Ω1.3 µΩ/Ω14 µΩ/Ω7 2 µΩ/Ω 1kΩ0.18 mΩ/Ω 100 kΩ0.67 mΩ/Ω 10 MΩ15 µΩ/Ω 10 Ω60 µΩ/Ω 1 kΩ0.15 mΩ/Ω 100 kΩ0.53 mΩ/Ω 10 MΩ0.19 nF to 1.1 nF(1.1 to 3.3) nF(3.3 to 11) nF(11 to 110) nF(110 to 330) nF330 nF to 1.1 µF(1.1 to 3.3) µF(3.3 to 11) µF(11 to 33) µF15 mF/F8.4 mF/F3.6 mF/F3.6 mF/F3.7 mF/F3.6 mF/F3.6 mF/F3.6 mF/F5.1 mF/FCapacitance - Source110 Hz to 10 kHz10 Hz to 3 kHz10 Hz to 1 kHz10 Hz to 1 kHz10 Hz to 1 kHz(10 to 600) Hz10 Hz to 300 Hz10 Hz to 150 Hz10 Hz to 120 HzVersion 008Expanded Uncertainty ofMeasurement ( /-)RangeIssued: December 11, 2019www.anab.orgPage 11 of 62100 µΩ/Ω1.9 mF/F1.1 mF/F1.2 mF/F1.2 mF/F1.2 mF/F1.8 mF/F0.23 mF/F0.25 mF/F0.21 mF/F0.25 mF/FReference Standard,Method, and/orEquipmentStandard resistors withbridge and DMMDecade resistors withbridge and DMMDecade resistors withbridge and DMMAC Resistor SetQuadTech 1730 LCR MeterStandard CapacitorsFluke 5520A Multi ProductCalibrator
Electrical – DC/Low FrequencyParameter/EquipmentCapacitance - Source110 Hz to 80 Hz(0 to 50) Hz(0 to 20) Hz(0 to 6) Hz(0 to 2) Hz(0 to 0.6) Hz(0 to 0.2) HzInductance - Measure1Inductance - Source1Expanded Uncertainty ofMeasurement ( /-)Range(33 to 110) µF(110 to 330) µF330 µF to 1.1 mF(1.1 to 3.3) mF(3.3 to 11) mF(11 to 33) mF(33 to 110) mF100 µH @ 1 kHz1 mH @ 1 kHz10 mH @ 1 kHz100 mH @ 1 kHz1 H @ 1 kHz500 µH @ 100 Hz500 µH @ 1 kHz2 mH @ 100 Hz2 mH @ 1 kHz20 mH @ 100 Hz20 mH @ 1 kHz1 H @ 100 Hz1 H @ 1 kHz10 H @ 100 Hz10 H @ 1 kHz5.6 mF/F5.6 mF/F8.7 mF/F5.5 mF/F5.5 mF/F8.5 mF/F12 mF/FQuadTech 1730 LCR Meter1.2 mH/H1 mH/H1.1 mH/H1 mH/H1.1 mH/H1 mH/H1 mH/H1 mH/H1 mH/H1 mH/HStandard Inductors40 µV to 5 V1 mV/VSquare Wave Signal1 MΩ at 1 kHz40 µV to 5 V1 mV/VDC Voltage, 50 ΩDC Voltage, 1 MΩ1 mV to 5 V1 mV to 200 V0.26 mV/V0.25 mV/VLeveled Sine WaveAmplitude5 mV to 5 V15 mV/VVersion 008Issued: December 11, 201943 mV/V43 mV/Vwww.anab.orgPage 12 of 62Fluke 5520A Multi ProductCalibrator1.2 mH/HOscilloscopes1Square Wave Signal50 Ω at 1 kHzLeveled Sine Wave Flatness 4.4 mVpp to 5.6 Vpp(relative to 50 kHz)0.1 Hz to 300 MHz(300 to 550) MHzReference Standard,Method, and/orEquipmentFluke 9500B/3200/9530Oscilloscope Calibrator
Electrical – DC/Low FrequencyParameter/EquipmentExpanded Uncertainty ofMeasurement ( /-)RangeOscilloscopes1Leveled Sine Wave Flatness 4.4 mVpp to 3.3 Vpp(relative to 50 kHz)550 MHz to 1.1 GHz(1.1 to 3.2) GHzTime Marker 50 ΩSource and Period9 ns to 55 sRise/Fall Time - SourcePulse Width - SourceElectrical Simulation ofThermocouple Indicators1Version 00852 mV/V52 mV/V0.25 μs/s150 psFluke 9500B/3200/9530Oscilloscope Calibrator27 ps(1 to 100) nsType B(250 to 350) ºC(350 to 445) ºC(445 to 580) ºC(580 to 750) C(750 to 1 000) C(1 000 to 1 820) CType C(0 to 250) ºC(250 to 1 000) ºC(1 000 to 1 500) ºC(1 500 to 1 800) ºC(1 800 to 2 000) ºC(2 000 to 2 250) ºC(2 250 to 2 315) ºCType E(-270 to -245) ºC(-245 to -195) ºC(-195 to -155) ºC(-155 to -90) ºC(-90 to 15) ºC(15 to 890) ºC(890 to 1 000) ºCType J(-210 to -180) ºC(-180 to -120) ºC(-120 to -50) ºC(-50 to 990) ºC(990 to 1 200) ºCIssued: December 11, 2019Reference Standard,Method, and/orEquipment52 ms/s1.1 C0.85 C0.67 C0.52 C0.43 C0.33 C0.23 ºC0.18 ºC0.21 ºC0.24 ºC0.27 ºC0.33 ºC0.37 ºC1.38 ºC0.21 ºC0.12 ºC0.09 ºC0.08 ºC0.07 ºC0.08 ºC0.14 ºC0.12 ºC0.09 ºC0.08 ºC0.08 ºCwww.anab.orgPage 13 of 62Ectron 1140AThermocouple Simulator
Electrical – DC/Low FrequencyParameter/EquipmentElectrical Simulation ofThermocouple Indicators1Version 008Expanded Uncertainty ofMeasurement ( /-)RangeType K(-270 to -255) ºC(-255 to -195) ºC(-195 to -115) ºC(-115 to -55) ºC(-55 to 1 000) ºC(1 000 to 1 372) ºCType N(-270 to -260) ºC(-260 to -200) ºC(-200 to -140) ºC(-140 to -70) ºC(-70 to 25) ºC(25 to 160) ºC(160 to 1 300) ºCType R(-50 to -30) ºC(-30 to 45) ºC(45 to 160) ºC(160 to 380) ºC(380 to 775) ºC(775 to 1 768) ºCType S(-50 to -30) ºC(-30 to -45) ºC(-45 to -105) ºC(-105 to 310) ºC(310 to 615) ºC(615 to 1 768) ºCType T(-270 to -255) ºC(-255 to -240) ºC(-240 to -210) ºC(-210 to -150) ºC(-150 to -40) ºC(-40 to 100) ºC(100 to 400) ºCIssued: December 11, 2019Reference Standard,Method, and/orEquipment2.5 ºC0.81 ºC0.14 ºC0.1 ºC0.08 ºC0.09 ºC5.8 ºC1.2 ºC0.27 ºC0.17 ºC0.14 ºC0.12 ºC0.1 ºC0.75 ºC0.63 ºC0.46 ºC0.35 ºC0.3 ºC0.25 ºC0.71 ºC0.64 ºC0.46 ºC0.38 ºC0.33 ºC0.3 ºC2.1 ºC0.56 ºC0.35 ºC0.21 ºC0.14 ºC0.09 ºC0.08 ºCwww.anab.orgPage 14 of 62Ectron 1140AThermocouple Simulator
Electrical – DC/Low FrequencyParameter/EquipmentElectrical Simulation ofRTD Indicators1Version 008RangeExpanded Uncertainty ofMeasurement ( /-)PT 395 100 Ω(-200 to 0) ºC(0 to 100) ºC(100 to 300) ºC(300 to 400) ºC(400 to 630) ºC(630 to 800) ºCPT 3926 100 Ω(-200 to 0) ºC(0 to 100) ºC(100 to 300) ºC(300 to 400) ºC(400 to 630) ºCPT 3916 100 Ω(-200 to -190) ºC(-190 to -80) ºC(-80 to 0) ºC(0 to 100) ºC(100 to 260) ºC(260 to 300) ºC(300 to 400) ºC(400 to 600) ºC(600 to 630) ºCPT 385 200 Ω(-200 to 100) ºC(100 to 260) ºC(260 to 300) ºC(300 to 400) ºC(400 to 600) ºC(600 to 630) ºCPT 385 500 Ω(-200 to -80) ºC(-80 to 100) ºC(100 to 260) ºC(260 to 400) ºC(400 to 600) ºC(600 to 630) ºCIssued: December 11, 2019Reference Standard,Method, and/orEquipment0.06 ºC0.08 ºC0.11 ºC0.12 ºC0.14 ºC0.27 ºC0.06 ºC0.08 ºC0.11 ºC0.12 ºC0.14 ºC0.29 ºC0.05 ºC0.06 ºC0.07 ºC0.08 ºC0.09 ºC0.11 ºC0.12 ºC0.27 ºC0.05 ºC0.06 ºC0.14 ºC0.15 ºC0.16 ºC0.19 ºC0.05 ºC0.06 ºC0.07 ºC0.09 ºC0.01 ºC0.13 ºCwww.anab.orgPage 15 of 62Fluke 5520A Multi ProductCalibrator
Electrical – DC/Low FrequencyParameter/EquipmentElectrical Simulation ofRTDs1Version 008RangeExpanded Uncertainty ofMeasurement ( /-)PT 395 100 Ω(-200 to 0) ºC(0 to 100) ºC(100 to 300) ºC(300 to 400) ºC(400 to 630) ºC(630 to 800) ºCPT 3926 100 Ω(-200 to 0) ºC(0 to 100) ºC(100 to 300) ºC(300 to 400) ºC(400 to 630) ºCPT 3916 100 Ω(-200 to -190) ºC(-190 to -80) ºC(-80 to 0) ºC(0 to 100) ºC(100 to 260) ºC(260 to 300) ºC(300 to 400) ºC(400 to 600) ºC(600 to 630) ºCPT 385 200 Ω(-200 to 100) ºC(100 to 260) ºC(260 to 300) ºC(300 to 400) ºC(400 to 600) ºC(600 to 630) ºCPT 385 500 Ω(-200 to -80) ºC(-80 to 100) ºC(100 to 260) ºC(260 to 400) ºC(400 to 600) ºC(600 to 630) ºCIssued: December 11, 2019Reference Standard,Method, and/orEquipment0.06 ºC0.08 ºC0.11 ºC0.12 ºC0.14 ºC0.27 ºC0.06 ºC0.08 ºC0.11 ºC0.12 ºC0.14 ºC0.29 ºC0.05 ºC0.06 ºC0.07 ºC0.08 ºC0.09 ºC0.11 ºC0.12 ºC0.27 ºC0.05 ºC0.06 ºC0.14 ºC0.15 ºC0.16 ºC0.19 ºC0.05 ºC0.06 ºC0.07 ºC0.09 ºC0.01 ºC0.13 ºCwww.anab.orgPage 16 of 62Fluke 5520A Multi ProductCalibrator
Electrical – DC/Low FrequencyParameter/EquipmentElectrical Simulation ofRTDs1Expanded Uncertainty ofMeasurement ( /-)RangePT 385 1 000 Ω(-200 to 0) ºC(0 to 100) ºC(100 to 260) ºC(260 to 300) ºC(300 to 600) ºC(600 to 630) ºCPtNi 120 Ω(-80 to 100) ºC(100 to 260) ºCCu 427 10 Ω(-100 to 260) ºC0.04 ºC0.05 ºC0.06 ºC0.07 ºC0.08 ºC0.27 ºCReference Standard,Method, and/orEquipmentFluke 5520A Multi ProductCalibrator0.09 ºC0.16 ºC0.35 ºCElectrical – RF/MicrowaveParameter/EquipmentRF Power - MeasureAbsolute Level1RF Power - MeasureAbsolute Level1RF Power - MeasureAbsolute Level1(-36 to 20) dBm9 kHz to 6 GHz(20 to 30) dBm(6 to 18) GHz(18 to 26.5) GHz(-20 to 20) dBm100 kHz to 30 MHz30 MHz to 2 GHz(1 to 18) GHz(18 to 26.5) GHz0.16 dB0.44 dB0.50 dB0.2 dB0.21 dB0.31 dB0.4 dB(-30 to 20) dBm100 kHz to 30 MHzRelative Power - Measure1100 kHz to 26.5 GHzVersion 008Expanded Uncertainty ofMeasurement ( /-)RangeIssued: December 11, 20193.1 % of reading(-10 to 0) dB(-20 to -10) dB(-30 to -20) dB(-40 to -30) dB(-50 to -40) dB(-60 to -50) dB(-70 to -60) dB(-80 to -70) dB0.02 dB0.03 dB0.03 dB0.05 dB0.06 dB0.06 dB0.07 dB0.07 dBwww.anab.orgPage 17 of 62Reference Standard,Method, and/orEquipmentAgilent E9304A/N1912AAgilent N5531S MeasuringReceiver with N5532ASensor ModuleAgilent N5531S MeasuringReceiver with N5532ASensor ModuleAgilent N5531S MeasuringReceiver with 8482ASensorAgilent N5531S MeasuringReceiver with N5532ASensor Module
Electrical – RF/MicrowaveParameter/EquipmentRelative Power - Measure1100 kHz to 26.5 GHzRF Power - Source1RF Power - Source1RangeReference Standard,Method, and/orEquipment0.08 dB0.08 dB0.09 dB0.1 dB0.1 dB0.1 dBAgilent N5531S MeasuringReceiver with N5532ASensor Module(-90 to -80) dB(-100 to -90) dB(-110 to -100) dB(-120 to -110) dB(-130 to -120) dB(-140 to -130) dB(-90 to -75) dBm250 kHz to 2 GHz(2 to 20) GHz(20 to 32) GHz(-75 to -10) dBm250 kHz to 2 GHz(2 to 20) GHz(20 to 32) GHz(-20 to -10) dBm250 kHz to 2 GHz(2 to 20) GHz(20 to 32) GHz(-10 to 10) dBm250 kHz to 2 GHz(2 to 20) GHz(20 to 32) GHz 10 dBm250 kHz to 2 GHz(2 to 20) GHz(20 to 32) GHzPhase Modulation- Source1100 kHz to 32 GHz0.73 dBm1 dBm1.2 dBm0.72 dBm1 dBm1.2 dBm0.61 dBm0.91 dBm0.93 dBmAgilent N5183A SignalGenerator0.63 dBm0.92 dBm1 dBmRate: DC to 1 MHzDC to 4 MHzLO Phase Noise @ 1GHzAmplitude Modulation1 Source100 kHz to 32 GHzRate: DC to 10 kHzDepths: 1% to 90 %Issued: December 11, 2019Agilent N5183A SignalGenerator1.4 dBm1.3 dBm1.3 dBm(-50 to 20) dBFrequency offset:(0.10 to 1 000) Hz(1 to 9 900) kHzVersion 008Expanded Uncertainty ofMeasurement ( /-)0.59 % of reading 0.01 rad0.48 dB0.64 dB4.1 % of readingwww.anab.orgPage 18 of 62Agilent N5183A SignalGeneratorKeysight E4440A SpectrumAnalyzerAgilent N5183A SignalGenerator
Electrical – RF/MicrowaveParameter/EquipmentExpanded Uncertainty ofMeasurement ( /-)RangeReference Standard,Method, and/orEquipmentAmplitude Modulation- Measure1100 kHz to 10 MHzRate: 20 Hz to 10 kHzDepths: 5 % to 99 %0.83 % of reading10 MHz to 3 GHzRate: 50 Hz to 100 kHzDepths: 20 % to 99 %0.59 % of reading10 MHz to 3 GHzRate: 50 Hz to 100 kHzDepths: 5 % to 20 %2.6 % of reading(3 to 26.5) GHzRate: 50 Hz to 100 kHzDepths: 20 % to 99 %1.6 % of readingRate: 50 Hz to 100 kHzDepths: 5 % to 20 %4.7 % of reading30 ns to 42 s10 nsRate: 200 Hz 20 kHzDev.: 0.7 rad1.1 % of reading100 kHz to 6.6 GHzRate:200 Hz, 20 kHzDev. 0.3 rad3.1 % of reading(6.6 to 13.2) GHzRate: 200 Hz 20 kHzDev.: 2.0 rad1.1 % of reading(6.6 to 13.2) GHzRate: 200 Hz 20 kHzDev.: 0.6 rad3.1 % of reading(13.2 to 26.5) GHzRate: 200 Hz 20 kHzDev.: 2.0 rad1.1 % of readingRate: 200 Hz 20 kHzDev.: 0.6 rad3.1 % of reading(3 to 26.5) GHzPulse Generation - Source1Repetition Frequency:0.10 Hz to 10.0 MHzPhase ModulationMeasure1100 kHz to 6.6 GHz(13.2 to 26.5) GHzFrequency Modulation1- Source100 kHz to 32 GHzVersion 0081 dB Rate: DC to 3 MHz3 dB Rate: DC to 7 MHzIssued: December 11, 20192 % of setting 20 Hzwww.anab.orgPage 19 of 62Agilent N5531S MeasuringReceiver with N5532ASensor ModulesAgilent N5183A SignalGeneratorAgilent N5531S MeasuringReceiver with N5532ASensor ModulesAgilent N5183A SignalGenerator
Electrical – RF/MicrowaveParameter/EquipmentExpanded Uncertainty ofMeasurement ( /-)RangeReference Standard,Method, and/orEquipmentFreq Modulation-Measure1Freq. Dev. Mod Rate Ratio 0.2250 kHz to 10 MHz250 kHz to 10 MHz10 MHz to 6.6 GHz10 MHz to 6.6 GHz(6.6 to 13.2) GHz(6.6 to 13.2) GHzVersion 008Rate: 20 Hz to 10 kHzDev.: 200 Hz to 40 kHzpeakFreq. Dev. Mod RateRatio 0.2Rate: 20 Hz to 10 kHzDev.: 200 Hz to 40 kHzpeakFreq. Dev. Mod RateRatio 1.2Rate: 50 Hz to 200kHzDev.: 250 Hz to 400 kHzpeakFreq. Dev. Mod RateRatio 0.2Rate: 50 Hz to 200kHzDev.: 250 Hz to 400 kHzpeakFreq. Dev. Mod RateRatio 0.451.6 % of reading1.1 % of reading1.6 % of readingAgilent N5531SMeasuring Receiverwith N5532A SensorModules1.1 % of readingRate: 50 Hz to 200kHzDev.: 250 Hz to 400 kHzpeakFreq. Dev. Mod RateRatio 0.22.6 % of readingRate: 50 Hz to 200kHzDev.: 250 Hz to 400 kHzpeakFreq. Dev. Mod RateRatio 81.1 % of readingIssued: December 11, 2019www.anab.orgPage 20 of 62
Electrical – RF/MicrowaveParameter/EquipmentExpanded Uncertainty ofMeasurement ( /-)RangeReference Standard,Method, and/orEquipmentFreq Modulation-Measure1Freq. Dev. Mod Rate Ratio 0.2(13.2 to 26.5) GHz(13.2 to 26.5) GHzRate: 50 Hz to 200kHzDev.: 250 Hz to 400 kHzpeakFreq. Dev. Mod RateRatio 0.23.9 % of readingRate: 50 Hz to 200kHzDev.: 250 Hz to 400 kHzpeakAgilent N5531SMeasuring Receiverwith N5532A SensorModules1.1 % of readingLength – Dimensional metrologyParameter/EquipmentRangeExpanded Uncertainty ofMeasurement ( /-)Reference Standard,Method, and/orEquipmentAngle(0.25 to 365) 0.69 m (12 µin/ in)Gage Blocks, GageAmplifier, Sine BarAngle Plates - Squareness2Up to 18 in0.32 m (5.6 µin/ in)(0.01 to 1) in(1 to 3) in4 in(5 to 12) in(12 to 20) in(1.4 1.3L) in(1 1.3L) in9.4 µin(5 2L) in(2 2.8L) µin100 mm(125 to 500) mm0.17 m(0.06 0.000 6L) mComparison to PrimaryMaster Gage BlocksIndicators1,2(0.000 1 to 6) in(5 8L) µinHorizontal MeasuringMachineCalipers1,2Up to 60 in(5 8L) µinGage BlocksMicrometers OD1,2Up to 12 in(5 8L) µinGage Blocks, OpticalParallelsHeight Measuring Devices1,2Up to 36 in(36 to 48) in(45 2L) in(7 3L) inGage BlocksGrind GagesUp to 100 mm0.35 mmDigital IndicatorGage Blocks2Version 008Issued: December 11, 2019www.anab.orgPage 21 of 62Gage Amplifier with probe,Master Square(s)Gage Blocks Gage BlockComparatorHorizontal MeasuringMachine
Length – Dimensional metrologyReference Standard,Method, and/orEquipmentParameter/EquipmentRangeExpanded Uncertainty ofMeasurement ( /-)Coating Thickness Gages1,2Up to 0.02 in58 µin 0.6RCoating Thickness GageStandardsUp to 0.10 in21 µinExternal Diameter1,2(0.0001 to 12) in(3 3L) µinInternal Diameter1,2(0.04 to 13) in(3 3L) µinUp to 8 inPitch (0.2 to 5) mm(87 1.9L) µinHorizontal MeasuringMachinePitch 90 – 4 TPIUp to 4 in(3.5 4.6L) µinThread Measuring WiresUp to 4 inSee footnote5Thread Setting PlugUp to 6 in6 to 12 in(43 11L) µin(30 7.5L) µinGlass Scale(5 to 100) X350 µinGlass Scale (Sphere)Up to 54 inDL(54 to 238) inDL(17 0.7DL) µin(1 1.4DL) µinLaser SystemLocal Area FlatnessUp to 238 inDL34 µinRepeat-O-MeterRoundness/CylindricityUp to 150 mm0.02 µmRondcom41cSurface Finish AnalysisUp to 500 µin2.4 µinProfilometer, MasterPatchProfilometers1Up to 500 µin3.1 µinMaster PatchOptical FlatsParallelism FlatnessUp to 6 in2.7 µin3.5 µin(25 2.4L) µinGage Block Comparator,Master FlatLaser Measuring System66 µin45 µinBall BarCMM SphereThread Plugs1,2Pitch DiameterMajor DiameterThread Rings (Adjustable)Pitch DiameterTactile Fit (Set to Plug)Optical Comparators1,2Linear AccuracyMagnificationSurface Plates1,2Overall FlatnessLinearityCMMsVersion 008Coating ThicknessStandardsHorizontal MeasuringMachineHorizontal MeasuringMachineHorizontal MeasuringMachine1,2Volumetric RepeatabilityIssued: December 11, 2019www.anab.orgPage 22 of 62
Length – Dimensional metrologyRangeExpanded Uncertainty ofMeasurement ( /-)Reference Standard,Method, and/orEquipmentLinearity(32 4.1L) µinGlass ScalesGraduated Scales1,2Glass, Steel, TapeUp to 12 in(1 to 200) ft(40 1L) µin(10 3L) µinLaser Measuring SystemHorizontal MeasuringSystems1,2Bore Gages22-pointUp to 8 in(8 to 60) in(6 1.7L) µin(3 2.5L) µinGage BlocksParameter/EquipmentVMMs1,2(0.24 to 9) in3-point(4.3 3L) µin 0.6RHorizontal MeasuringMachine(85 7L) µin 0.6RCylindrical RingsProtractors(0 to 90) º0.16 ºSine Bar, Gage BlocksChamfer Gages2(0.179 to 2.749) in280 µin 0.6RChamfer Rings1.5 arc secondsGage Amplifier w/probe, Master Square(s)Cylindrical Squares SquarenessUp to 12 inCylindricityFeeler/Thickness Gages2Gage Amplifier w/Probe(s)Gage Balls/Spheres2 DiameterRoundnessIndicator Calibrator2 Linearity0.02 µmRoundness MachineHorizontal MeasuringSystemUp to 0.2 in(4.3 3L) µinUp to 0.1 in10 µinGage Blocks(4.3 3D) µinGage Blocks, HorizontalMeasuring SystemUp to 6 in0.02 µmRoundness MachineHorizontal MeasuringSystemUp to 6 in60 µin 0.6RUp to 12 in(44 2.6L) µin 0.6RGage BlocksUp to 24 in35
Fluke 52120A Amplifier with shunts DC Current - Source1 (100 to 150) A (150 to 1 025) A 5 mA/A 20 mA 5.1 mA/A 0.9 A Fluke 5520A Multi Product Calibrator with 50-turn Coil DC Power – 10.9 mW to 3.06 kWSource 10.9 µW to 10.9 mW (3.06 to 20.9) kW 0.18 mW/W 0.17 mW/W 0.54 mW/W Fluke
Calibration (from VIM3) Continued NOTE 1 A calibration may be expressed by a statement, calibration function, calibration diagram, calibration curve, or calibration table. In some cases, it may consist of an additive or multiplicative correction of the indication with associated measurement uncertainty. NOTE 2 Calibration should not be .
Practice Accreditation Program Web based program launched in January 2011 Application, interview and data collection forms, surveyor report and summary are all captured electronically No more paper ACR-ASTRO accreditation outcomes 3 Categories: Accreditation Defer Denial of Accreditation ACR-ASTRO Accreditation Accreditation Cycle is 3 years
Host action Target needed * : Timings are given for information only, they can vary depending on the Host capabilities Calibration Data result Calibration data Calibration data Calibration data Calibration data Device initialization SPADs calibration Temperature calibration Offset calibrat
calibration. The vertical comparator was built during the year 2003. The calibration facility is designed to calibrate up to 3-m-long invar rods, both for system calibration of digital levels and for tradi-tional rod calibration. SLAC System Calibration Facility The procedure of system calibration of digital levels is described
1 Manual calibration introduction 3 1.1 Purpose 3 1.2 Manual calibration software 3 2 Manual calibration overview 3 3 Manual calibration process 4 3.1 Setup MCR program 4 3.2 Calibration pattern positioning 9 3.3 Capturing pattern image 14 3.4 Using the Synergy Calibration tool 18 3.5 Fine tuning side images 24
Calibration C-0942, Mechanical(Dimensional, Pressure, Mass & Volume) Calibration C-0943 & Thermal Calibration C-0944. Our company is also ISO 17025:2005 Certified for Mechanical Calibration, Elctro Technical Calibration & Thermal Calibration. The firm is proud to have earned distinction in its various services and we are performing as a
Accreditation Issue date Expiration date Not applicable The Joint Commission Accreditation CARF accreditation AOA accreditation COA accreditation Please list other accreditation(s) held by your organization Licensure/certification Entity issuing license or certification Type of license or certificate License number Expiration date 1. 2. 3. 4.
The Accreditation Criteria are divided into three levels. To achieve Provisional Accreditation, a two year term, providers must comply with Criteria 1, 2, 3, and 7–12. Providers seeking full Accreditation or reaccreditation for a four-year term must comply with Criteria 1–15. To achieve Accreditation with
