Statistical Process Control Toolkit Reference Manual
aBook Page 1 Wednesday, April 22, 1998 8:21 AMLabVIEW Statistical Process Control ToolkitReference Manual Copyright 1994 National Instruments Corporation.All rights reserved.Part Number 320753A-01September 1994
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aBook Page iii Wednesday, April 22, 1998 8:21 AMLimited WarrantyThe media on which you receive National Instruments software are warranted not to fail to executeprogramming instructions, due to defects in materials and workmanship, for a period of 90 days fromdate of shipment, as evidenced by receipts or other documentation. National Instruments will, at itsoption, repair or replace software media that do not execute programming instructions if NationalInstruments receives notice of such defects during the warranty period. National Instruments doesnot warrant that the operation of the software shall be uninterrupted or error free.A Return Material Authorization (RMA) number must be obtained from the factory and clearlymarked on the outside of the package before any equipment will be accepted for warranty work.National Instruments will pay the shipping costs of returning to the owner parts which are coveredby warranty.National Instruments believes that the information in this manual is accurate. The document hasbeen carefully reviewed for technical accuracy. In the event that technical or typographical errorsexist, National Instruments reserves the right to make changes to subsequent editions of thisdocument without prior notice to holders of this edition. The reader should consult NationalInstruments if errors are suspected. In no event shall National Instruments be liable for any damagesarising out of or related to this document or the information contained in it.EXCEPT AS SPECIFIED HEREIN, NATIONAL INSTRUMENTS MAKES NO WARRANTIES,EXPRESS OR IMPLIED, AND SPECIFICALLY DISCLAIMS ANY WARRANTY OFMERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE. CUSTOMER'S RIGHTTO RECOVER DAMAGES CAUSED BY FAULT OR NEGLIGENCE ON THE PART OFNATIONAL INSTRUMENTS SHALL BE LIMITED TO THE AMOUNT THERETOFORE PAIDBY THE CUSTOMER. NATIONAL INSTRUMENTS WILL NOT BE LIABLE FOR DAMAGESRESULTING FROM LOSS OF DATA, PROFITS, USE OF PRODUCTS, OR INCIDENTAL ORCONSEQUENTIAL DAMAGES, EVEN IF ADVISED OF THE POSSIBILITY THEREOF. Thislimitation of the liability of National Instruments will apply regardless of the form of action, whetherin contract or tort, including negligence. Any action against National Instruments must be broughtwithin one year after the cause of action accrues. National Instruments shall not be liable for anydelay in performance due to causes beyond its reasonable control. The warranty provided hereindoes not cover damages, defects, malfunctions, or service failures caused by owner's failure tofollow the National Instruments installation, operation, or maintenance instructions; owner'smodification of the product; owner's abuse, misuse, or negligent acts; and power failure or surges,fire, flood, accident, actions of third parties, or other events outside reasonable control.
aBook Page iv Wednesday, April 22, 1998 8:21 AMCopyrightUnder the copyright laws, this publication may not be reproduced or transmitted in any form,electronic or mechanical, including photocopying, recording, storing in an information retrievalsystem, or translating, in whole or in part, without the prior written consent of National InstrumentsCorporation.TrademarksLabVIEW is a trademark of National Instruments Corporation.Product and company names listed are trademarks or trade names of their respective companies.WARNING REGARDING MEDICAL AND CLINICAL USEOF NATIONAL INSTRUMENTS PRODUCTSNational Instruments products are not designed with components and testing intended to ensure alevel of reliability suitable for use in treatment and diagnosis of humans. Applications of NationalInstruments products involving medical or clinical treatment can create a potential for accidentalinjury caused by product failure, or by errors on the part of the user or application designer. Any useor application of National Instruments products for or involving medical or clinical treatment mustbe performed by properly trained and qualified medical personnel, and all traditional medicalsafeguards, equipment, and procedures that are appropriate in the particular situation to preventserious injury or death should always continue to be used when National Instruments products arebeing used. National Instruments products are NOT intended to be a substitute for any form ofestablished process, procedure, or equipment used to monitor or safeguard human health and safetyin medical or clinical treatment.
aBook Page v Wednesday, April 22, 1998 8:21 AMContentsAbout This Manual .ixOrganization of This Manual .ixConventions Used in This Manual.xRelated Documentation .xiiCustomer Communication .xiiChapter 1Introduction to StatisticalProcess Control in LabVIEW .1-1Installation .1-1Windows .1-1SPARCstation .1-2Macintosh .1-3Requirements for Using the SPC Toolkit .1-3SPC Toolkit Organization .1-4VI Libraries .1-4Custom Controls .1-6LabVIEW SPC Toolkit Examples .1-7Implementing SPC Applications in LabVIEW .1-8Representation of Process Data in LabVIEW .1-8Viewing Raw Process Data .1-9Creating Control Charts andDetermining Whether the Process Is in Control .1-13Detecting Out-of-Control Points and Process Shift .1-15Process Capability Analysis .1-19Pareto Analysis .1-20Chapter 2Control Chart VIs .2-1Calculating Control Chart Limits and Points .2-1Variables Chart VIs .2-2Attributes Charts VIs .2-3VIs for Drawing Charts .2-4VIs for Plotting Control Chart Points and Limits .2-5VIs for Creating Graphs of Raw Process Data .2-5Rule Checker VIs for TestingOut of Limits, Run Rules, and Process Shift .2-7 National Instruments CorporationvLabVIEW SPC Toolkit Reference Manual
aBook Page vi Wednesday, April 22, 1998 8:21 AMContentsVariables Chart VIs .2-7X-Bar & s Chart .2-7X-Bar & R Chart .2-11X & mR Chart .2-14mX-bar & mR Chart .2-18Single Point X-Bar & R/S .2-22Single Point x/mX-bar & mR .2-23Attributes Charts VIs .2-24p chart .2-24np Chart .2-27c Chart .2-29u Chart .2-32Draw Control Chart VIs .2-35Draw Control Chart .2-35Draw Chart with Zones .2-36Draw Chart with Var Limits .2-37Draw Run Chart .2-38Draw Tier Chart .2-40Rule Checker VIs .2-42Check Control Limits .2-42Rule Checker (AT&T/WE) .2-43Rule Checker (Nelson) .2-44Process Shift Detector .2-46Sequence Checker .2-47Chapter 3Process Statistics VIs .3-1Process Mean and Sigma .3-1Compute Process Capability .3-3Sample Statistics VI .3-5General Histogram .3-6Fit Nrml PDF to Histogram .3-8Normal PDF Graph with Limits .3-9Plot Normal PDF .3-10Vertical Bar Graph with Limits .3-12Vertical Bar Graph .3-13Rotate Graph .3-14Chapter 4Pareto Analysis VIs .4-1Pareto Counter .4-2Pareto Chart .4-3Cause Code Lookup .4-4Array to Bar/Comb Graph .4-5LabVIEW SPC Toolkit Reference Manualvi National Instruments Corporation
aBook Page vii Wednesday, April 22, 1998 8:21 AMContentsAppendixCustomer Communication.A-1Glossary .G-1FiguresFigure 1-1. Basic Run Chart .1-10Figure 1-2. Diagram for Basic Run Chart .1-10Figure 1-3. Basic Histogram Plot .1-11Figure 1-4. Diagram for Basic Histogram Plot .1-12Figure 1-5. Basic Tier Chart .1-12Figure 1-6. Diagram for Basic Tier Chart .1-13Figure 1-7. X-bar and S Chart Example .1-14Figure 1-8. Diagram for X-bar and S Chart Example .1-14Figure 1-9. p Chart with Variable Limits VI Example .1-15Figure 1-10. Diagram for p Chart with Variable Limits VIExample.1-15Figure 1-11. X-bar and R Chart Check Limits Example .1-16Figure 1-12. Diagram for X-bar and R Chart Check LimitsExample .1-17Figure 1-13. Zone Rule Test (AT&T/WE) Example .1-18Figure 1-14. Diagram for Zone Rule Test (AT&T/WE) Example.1-18Figure 1-15. Process Capability Example 1 .1-20Figure 1-16. Diagram for Process Capability Example 1 .1-20Figure 1-17. Pareto Chart Example .1-21Figure 1-18. Diagram for Pareto Chart Example .1-21 National Instruments CorporationviiLabVIEW SPC Toolkit Reference Manual
aBook Page ix Wednesday, April 22, 1998 8:21 AMIntroductionAbout This ManualThe LabVIEW Statistical Process Control Toolkit Reference Manualdescribes the LabVIEW add-on package you can use for implementingstatistical process control functions.Organization of This ManualThis manual is organized as follows: Chapter 1, Introduction to Statistical Process Control in LabVIEW,contains installation instructions, gives an overview of StatisticalProcess Control (SPC), and discusses the LabVIEW SPC ToolkitVIs and examples. Chapter 2, Control Chart VIs, describes the control chart VIs,which include the variables charts, attributes charts, chart drawing,and rule checking VIs. The control chart VIs compute control limitsfor control charts, create control chart graphs, and apply rules tocontrol chart data that detect out-of-control conditions. Chapter 3, Process Statistics VIs, describes the process statisticsVIs, which are useful for process capability analysis and forviewing and measuring process distribution. Chapter 4, Pareto Analysis VIs, describes the Pareto analysis VIs,which include the Pareto Counter VI, the Pareto Chart VI, and theCause Code Lookup VI. The Array to Bar/Comb VI, which thePareto Analysis VIs use as a subVI, is also included. The Appendix, Customer Communication, contains forms you canuse to request help from National Instruments or to comment on ourproducts and manuals. The Glossary contains an alphabetical list and description of termsused in this manual, including abbreviations, acronyms, metricprefixes, mnemonics, and symbols. National Instruments CorporationixLabVIEW SPC Toolkit Reference Manual
aBook Page x Wednesday, April 22, 1998 8:21 AMAbout This ManualConventions Used in This ManualThe following conventions are used in this manual:boldBold text denotes menus, menu items, and VIinput and output parameters.italicItalic text denotes emphasis, a cross reference, oran introduction to a key concept. Italic text alsodenotes a variable such as filename or N whenit appears in a text passage.bold italicBold italic text denotes a note, caution, orwarning.monospaceMonospace font denotes text or characters thatyou enter using the keyboard. File names,directory names, drive names, sections of code,programming examples, syntax examples, andmessages and responses that the computerautomatically prints to the screen also appear inthis font.!Warning:!Caution:Note:LabVIEW SPC Toolkit Reference ManualThis icon to the left of bold italicized text denotesa warning, which alerts you to the possibility ofdamage to you or your equipment.This icon to the left of bold italicized text denotesa caution, which alerts you to the possibility ofdata loss or a system crash.This icon to the left of bold italicized text denotesa note, which alerts you to importantinformation.x National Instruments Corporation
aBook Page xi Wednesday, April 22, 1998 8:21 AMAbout This ManualLabVIEW DataTypesControlEach VI description gives a data type picture foreach input and output parameter, as illustrated inthe following table.IndicatorData TypeSigned 8-bit integerSigned 16-bit integerSigned 32-bit integerUnsigned 8-bit integerUnsigned 16-bit integerUnsigned 32-bit integerSingle-precision floating-point numberDouble-precision floating-point numberExtended-precision floating-point numberStringBooleanArray of signed 32-bit integersClusterFile RefnumAbbreviations, acronyms, metric prefixes, mnemonics, symbols, andterms are listed in the Glossary. National Instruments CorporationxiLabVIEW SPC Toolkit Reference Manual
aBook Page xii Wednesday, April 22, 1998 8:21 AMAbout This ManualRelated DocumentationThe following documents contain information that you may find helpfulas you read this manual: Your LabVIEW tutorial Your LabVIEW user manual American Society for Quality Control. American NationalStandard. Definitions, Symbols, Formulas, and Tables for ControlCharts, 1987. Publication number: ANSI/ASQC A1-1987. Breyfogle, Forest W., Statistical Methods for Testing, Development,and Manufacturing, John Wiley and Sons, 1992. Montgomery, Douglas C., Introduction to Statistical QualityControl, J. Wiley and Sons, 2nd edition, 1991. Wheeler, Donald J. and Chambers, David S., UnderstandingStatistical Process Control, SPC Press, 2nd edition, 1992.Customer CommunicationNational Instruments wants to receive your comments on our productsand manuals. We are interested in the applications you develop with ourproducts, and we want to help if you have problems with them. To makeit easy for you to contact us, this manual contains comment and technicalsupport forms for you to complete. These forms are in the appendix,Customer Communication, at the end of this manual.LabVIEW SPC Toolkit Reference Manualxii National Instruments Corporation
aBook Page 1 Wednesday, April 22, 1998 8:21 AMChapter1Introduction to StatisticalProcess Control inLabVIEWThis chapter contains the installation procedure, gives an overview ofStatistical Process Control (SPC), and discusses the LabVIEW SPCToolkit VIs and examples.InstallationThe following sections contain instructions for installing the SPC Toolkiton Windows, Sun SPARCstation, and Macintosh. The SPC Toolkitcomes in compressed form on floppy disks. Installing the SPC Toolkitrequires approximately 4 MB.WindowsYou can install the SPC Toolkit from the DOS prompt, the Windows FileManager, or with the Run. command from the File menu of theProgram Manager.1.2.Insert the first SPC Toolkit disk into the 3.5-in. disk drive and run theSETUP.EXE program using one of the following three methods.a.From Windows, select Run. from the File menu of theProgram Manager. A dialog box appears. Type X:\SETUP(where X is the proper drive designation). Press enter orselect OK.b.From Windows, launch the File Manager. Click on the driveicon that contains the installation disk. Find SETUP.EXE in thelist of files on that disk and double-click on it.After you choose an installation option, follow the instructions thatappear on the screen. The installer will prompt you to name thedirectory that contains LabVIEW and its associated files.After you install the LabVIEW SPC Toolkit, your LabVIEW directoryshould contain a new SPC directory, and the LabVIEW Functions andControls menus will contain SPC entries the next time you launchLabVIEW. National Instruments Corporation1-1LabVIEW SPC Toolkit Reference Manual
aBook Page 2 Wednesday, April 22, 1998 8:21 AMIntroduction to Statistical Process Control in LabVIEWChapter 1SPARCstationYou can install the SPC Toolkit as shown in the following steps. You donot need root privileges to install the SPC Toolkit, but you must be ableto write to the LabVIEW directory where the SPC Toolkit will beinstalled.On systems running Solaris 2.2 or later you must determine whether yoursystem is running the volume manager, by entering the followingcommand:ps -a fgrep voldThe following message usually appears to tell you that the volumemanager is running:14818 pts/9 S 0:01 /usr/sbin/voldIf volume manager is running, install the SPC toolkit as follows:1.Use the cd command to change to a directory where you have writepermission, such as /var/tmp or your home directory.2.Insert the first SPC Toolkit disk into the 3.5 in. disk drive.3.Type volcheck.4.Type tar xf /vol/dev/aliases/floppy0 INSTALL toextract the installation script.5.To run the installation script, type ./INSTALL. Follow theinstructions on the screen. The installer will prompt you to name thedirectory that contains LabVIEW and its associated files.If volume manager is not running or if your system runs Solaris 1, installthe SPC toolkit as follows:1.Use the cd command to change to a directory where you have writepermission, such as /var/tmp or your home directory.2.Insert the first SPC Toolkit disk into the 3.5 in. disk drive.3.Type tar xf /dev/rfd0c INSTALL to extract the installationscript.4.To run the installation script, type ./INSTALL. Follow theinstructions on the screen. The installer will prompt you to name thedirectory that contains LabVIEW and its associated files.LabVIEW SPC Toolkit Reference Manual1-2 National Instruments Corporation
aBook Page 3 Wednesday, April 22, 1998 8:21 AMChapter 1Introduction to Statistical Process Control in LabVIEWAfter you install the LabVIEW SPC Toolkit, your LabVIEW directoryshould contain a new SPC directory, and the LabVIEW Functions andControls menus will contain SPC entries the next time you launchLabVIEW.Macintosh1.Insert the first SPC Toolkit disk into the 3.5 in. disk drive anddouble-click on the LabVIEW SPC Toolkit Installer icon.2.After you select the Install button, you are prompted to select adestination directory. Select your LabVIEW folder.3.Follow the instructions on the screen.After you install the LabVIEW SPC Toolkit, your LabVIEW directoryshould contain a new SPC directory, and the LabVIEW Functions andControls menus will contain SPC entries the next time you launchLabVIEW.Requirements for Using the SPC ToolkitSome of what you need to build an SPC application is already part of theLabVIEW programming environment. The SPC Toolkit package addsthe missing pieces you need to complete your application. The SPCToolkit consists of a set of VI libraries that implement key SPC functionssuch as control charts, process statistics, and Pareto analysis. The SPCToolkit also contains several subVIs that generate the typical SPCgraphical presentations.To use Statistical Process Control effectively, you must be trained inSPC methods. SPC training is necessary because success in an SPCprogram depends on educated judgment and experience. Roteapplication of pre-existing templates is no substitute for this judgment.The SPC Toolkit package is a way to use LabVIEW to create SPCapplications. If you are using this package to analyze and improve yourprocess, you must receive training in SPC methods or have access tosomeone who has SPC expertise.Two good sources on Statistical Process Control methods are theWheeler and Chambers work and the Montgomery work cited in theRelated Documentation section of About This Manual. The firstreference can help you understand how to apply SPC methods, and the National Instruments Corporation1-3LabVIEW SPC Toolkit Reference Manual
aBook Page 4 Wednesday, April 22, 1998 8:21 AMIntroduction to Statistical Process Control in LabVIEWChapter 1second reference provides a good theoretical and mathematical basisfor SPC.You must have LabVIEW programming experience to use this package.You can explore the simple examples included in the SPC EXMP libraryafter going through Chapter 1 in both the LabVIEW user and tutorialmanuals which cover basic LabVIEW principles. To modify the moreadvanced SPC application examples successfully, however, you must bean advanced LabVIEW user.In the next section you will take a brief look at the organization of theSPC VIs. Then the following section guides you through some of theLabVIEW programming techniques you will use in statisticalprocessing.SPC Toolkit OrganizationThe SPC Toolkit is organized into three sections: VI Libraries, CustomControls, and Examples.VI LibrariesAfter you have read this chapter, you are ready to begin using the SPCToolkit VIs. Click on the block diagram to activate it and select SPCunder the Functions menu. You see the menu and submenu shown in thefollowing illustration. Then select the VI you want; the iconcorresponding to that VI will appear in the block diagram, ready for youto wire it.Note:The screens illustrated in this manual were taken on the Macintosh. Ifyou are using Sun or Windows, your screens will look slightly different,but the information on the screens is the same across all threeplatforms.LabVIEW SPC Toolkit Reference Manual1-4 National Instruments Corporation
aBook Page 5 Wednesday, April 22, 1998 8:21 AMChapter 1Introduction to Statistical Process Control in LabVIEWThe Control Chart VIs include VIs for calculating control chart limits forboth attributes and variables charts, drawing control chart graphs, andapplying run rules to control charts.The Process Statistics VIs include VIs for estimating process distributionand capability, calculating and plotting histograms, and functions forplotting and fitting normal probability distribution functions tohistograms.The Pareto Analysis VIs include VIs for counting and sorting assignedcauses and for creating Pareto charts.When you view the VIs from your block diagram using the help window,notice that some of the input parameters are labeled in bold typeface.Bold typeface identifies parameters that should be wired to make the VIoperate properly. Plain typeface identifies input parameters that areoptional. Optional parameters can help you take advantage of advancedmodes of operation, but are not necessary for the VI to work. When youdo not wire the optional input parameters they are automatically set toreasonable default values. National Instruments Corporation1-5LabVIEW SPC Toolkit Reference Manual
aBook Page 6 Wednesday, April 22, 1998 8:21 AMIntroduction to Statistical Process Control in LabVIEWChapter 1Custom ControlsA set of custom controls for SPC graphs and legends are also installed aspart of the LabVIEW front panel Controls menu. These include XYgraphs specially preformatted to match the multiplot XY graphs outputby the various SPC subVIs. The following illustration shows the SPCGraphs & Legends palette with a set of custom controls for use with theSPC Toolkit VIs.The custom controls are installed as part of SPC Toolkit. These customcontrols are pre-formatted and labeled X-Y graphs and legends forwiring directly to the outputs of the drawing VIs for control charts,process statistics and Pareto analysis. They are as follows:Basic Control Chart. A pre-formatted X-Y graph for use with the DrawControl Chart VI.Control Chart Lines cluster. A cluster displaying values for the controlchart lines for use as a legend with all the drawing VIs for control charts.Control Chart with Zones. A pre-formatted X-Y graph for use with theDraw Control Chart with Var Limits VI.Control Chart Zones cluster. A cluster displaying values for the controlchart zones A, B and C, for use as a legend with the Draw Control Chartwith Zones VI.LabVIEW SPC Toolkit Reference Manual1-6 National Instruments Corporation
aBook Page 7 Wednesday, April 22, 1998 8:21 AMChapter 1Introduction to Statistical Process Control in LabVIEWControl Chart with Var Limits. A pre-formatted X-Y graph for usewith the Draw Control Chart with Var Limits VI.Control Chart (show pts not in control). A pre-formatted X-Y graphuseful for highlighting out of control points. See the example VI X-bar& S Chart correct limits in SPC EXMP.llb for a demonstration of howto use this type of graph format.Control Chart with Zones (show pts). A pre-formatted X-Y graphuseful for highlighting out of control points on a Control Chart withZones. See the example VI Zone Rule Test (Nelson) Example inSPC EXMP.llb for a demonstration of how to use this type of graphformat.Control Chart and Limits cluster. A cluster containing a pre-formattedX-Y graph and three numeric indicators for the control chart lines. Thisis a useful organization and grouping for a control chart and limit values.Run Chart with Limits. A pre-formatted X-Y graph for use with theDraw Run Chart VI.Tier Chart. A pre-formatted X-Y graph for use with the Draw Tier ChartVI.Histogram Bar Graph with Limits. A pre-formatted X-Y graph for usewith the Draw Vertical Bar Graph with Limits VI.Normal PDF Graph with Limits. A pre-formatted X-Y graph for usewith the Normal PDF Graph with Limits VI.Histogram and Normal PDF Plot. A pre-formatted X-Y graph for usewith histogram and superimposed normal PDF plot with limits. See theexample VI Proc Cap Example 2 in SCP EXMP.llb for ademonstration of how to use this type of graph format.Pareto Chart. A pre-formatted X-Y graph for use with either ParetoChart output of the Pareto Chart VI.Pareto Chart legend. A pre-formatted table indicator for use with thelegend output of the Pareto Chart VI.LabVIEW SPC Toolkit ExamplesThere are two libraries of examples with the SPC Toolkit. TheSPC EXMP.llb library contains basic to intermediate SPC examples. National Instruments Corporation1-7LabVIEW SPC Toolkit Reference Manual
aBook Page 8 Wednesday, April 22, 1998 8:21 AMIntroduction to Statistical Process Control in LabVIEWChapter 1These examples are useful for getting started and learning how to groupthe SPC VIs to perform typical SPC calculations and presentations.The SPC DEMO.llb (SPC demonstration library) contains an exampleapplication, the Real-time SPC Demo, that analyzes process dataacquired point by point. This is a more advanced VI that you couldmodify once you are more proficient at using the SPC Toolkit.These libraries of examples are contained in the SPC directory in yourLabVIEW folder or directory.Implementing SPC Applications in LabVIEWThis section discusses the main components that make up an SPCapplication and guides you through some of the programming techniquesyou can use in your statistica
statistical process control functions. Organization of This Manual This manual is organized as follows: Chapter 1, Introduction to Statistical Process Control in LabVIEW, contains installation instructions, gives an overview of Statistical Process Control (SPC), and discuss
statistical process control functions. Organization of This Manual This manual is organized as follows: Chapter 1, Introduction to Statistical Process Control in LabVIEW, contains installation instructions, gives an overview of Statistical Process Control (SPC), and discusses the LabVIEW SPC Toolkit VIs and examples. Chapter 2,
Statistical Process Control (SPC) applies statistical methods to monitor and control a process to operate at full potential. Statistical process control is a collection of tools that when used together can result in process stability and variance reduction. Control charts are used in SPC for measuring the variation in the process and that can be
This section discusses the basic concepts of statistical process control, quality control and process capability. 1. How did Statistical Quality Control Begin? 2. What are Process Control Techniques? 3. What is Process Control? 4. What to do if the process is "Out of Control"? 5. What to do if "In Control" but Unacceptable? 6. What is Process .
documents available for each template type 6 How to Access the Toolkit. ID NOW MARKETING TOOLKIT 7 Toolkit Templates: Printable MAILER POSTER SHELF TALKER/ SIGN. ID NOW MARKETING TOOLKIT 8 Toolkit Templates: Digital SOCIAL MEDIA AD SOCIAL MEDIA POST WEB CONTENT BLOCKS
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The process is then said to be under statistical control. If a process is unstable, that is because unusual factors are operating on the process. These factors, known as special causes, result in the process being out of statistical control. Shewhart recognised that we make mistakes at times, in that we take action when we should not do so.
at raising their interest in statistical science and practice and enhance their statistical culture. I hope that the new edition of the Statistical Reference Book will respond to the high requirements and needs of the Bulgarian public by objective and quality statistical information, presented in an accessible and understandable way.
bit more money each day. It will work on any index, instrument or currency pair. If you can have a chart up on your computer screen, you can look for this strategy. It works on all timeframes as well – one and two minute’s right up to daily and weekly charts. I have been using the strategy for the past 5 years, and it does work, simple as that! Just a quick point, this eBook is free to .
