LTE And LTE-A Products - EMPOS
A passion for performance. LTE and LTE-A Products
LTE TEST CHALLENGES title name LTE (Long Term Evolution) has been chosen by operators globally for the next generation of cellular technology. A number of operators and vendors have also already committed to the next major step, LTE-Advanced. Manufacturers of LTE and LTE-Advanced infrastructure and devices need reliable test instruments capable of addressing the challenges introduced by this fast growing standard. Aeroflex has the solutions. The LTE E-UTRAN places considerable demands on the architecture of UEs and eNodeBs such as higher data rates, multi-band support, wider bandwidths, reduced latency, more complex modulation and antenna configurations. These all need to be thoroughly tested to deliver the quality of service customers expect. LTE-Advanced further adds to this complexity by introducing carrier aggregation, integration of advanced antenna techniques and downlink data rates reaching 1 Gbps in low mobility conditions. Additionally, interoperability with legacy radio access technologies must be factored into the design to enable a seamless user experience. “The inherent complexities of LTE require equipment to be thoroughly tested to deliver the value customers expect”. For the next generation of mobile devices to achieve the ambition of providing a mobile broadband experience to match fixed broadband – including services such as high definition video streaming – it is necessary to test new devices using a layer-by-layer approach. A complete end-to-end test scenario must emulate real-world signal conditions. Ensuring good cell-edge performance is another challenge, especially as the number of users in the cell grows and, with it, the signal-to-noise level. To thoroughly and efficiently test LTE devices requires comprehensive test coverage: RF, baseband and protocol. Aeroflex addresses these challenges with a growing test portfolio that spans R&D, production and manufacturing.
Synergies in title name Aeroflex’s Portfolio Aeroflex delivered the world’s first LTE test mobile in 2007 and has since established itself as a leader in LTE test with an in-depth understanding of the LTE standards, the essential elements that define system performance, and the key test requirements that guarantee flawless deployment. Aeroflex has also worked with major vendors to publicly demonstrate carrier aggregation – a key feature of LTE-Advanced. Aeroflex’s complete portfolio of LTE solutions addresses all aspects of LTE test. With test solutions ranging from R&D through to manufacturing, Aeroflex tests everything from chipsets and handsets to base stations and end user services. The Aeroflex TM500 is the industry’s defacto test mobile fully supporting LTE network development, verification and optimization. It is also widely used for operator pre-commercial launch trials and benchmarking. The Aeroflex 7100 UE test system is tested against and interoperable with the TM500 and supports the same 3GPP releases. This enables mobile device and chipset vendors to have a high level of confidence in the successful operation of their devices on a live network. The PXI 3000 Series Test System, already widely used for 2G and 3G handset production, extends coverage to the production floor. The S-Series Digital Signal Generators and Vector Analyzers further complement the R&D and manufacturing tools by providing class-leading modulation and phase noise performance with intuitive touch-screen control to enable the most demanding LTE measurements to be made simply, quickly and accurately. Infrastructure Terminal Testing Testing Development Stage TM500 7100 R&D X X IOT X X Conformance X X Production X PXI 3000 X X S-Series X X
7100 Digital Radio Test Set Covering All Phases of LTE Terminal Testing The 7100 Digital Radio Test Set is an LTE network emulator for testing the RF, baseband, and protocol layers of wireless devices. The 7100 is the ideal solution for RF design and verification, functional test, integration and regression test groups. These teams benefit from the ease of use, comprehensive test capability, speed and low cost of ownership offered by the 7100. The 7100 simulates the E-UTRAN and EPC (Enhanced Packet Core) to provide a realistic test environment for LTE terminals. Test procedures control the characteristics of the simulated network to allow a wide range of repeatable test scenarios to be created. An optional integrated Fading Simulator and AWGN source is available, allowing real-world signal conditions to be created in the lab. LTE Call Box Mode for functional and application tests All the key measurements are provided for characterizing the performance of LTE mobile devices, both at the radio interface and throughout the protocol stack, including the PDCP core network and IMS layers. End-to-end performance can be accurately assessed, along with correct idle mode and connected mode behavior with the 7100's Network Simulation mode. Call Box mode features a test campaign manager facility, which enables test sequences to be defined and run from the 7100 touch-screen GUI.
LTE RF Parametric Testing The 7100 provides a comprehensive set of LTE RF measurements, performed in both signaling and non-signaling modes. The 7100 call box provides an easy interface for measuring and monitoring RF behavior of LTE devices while the device is interacting with the emulated network. A built-in spectrum analyzer provides measurement tools for complex problem solving. Additionally, 3GPP 36.521-1 LTE FDD and TDD RF test cases can be run using the test campaign manager. Performance Tests and Data Throughput Tests Under Real-world Conditions The 7100 combines LTE baseband fading and AWGN to enable simulation of a wide variety of real-world signal conditions in the lab. The innovative software-defined radio techniques employed not only reduce the cost of adding fading to a test environment, but also allow testing to be completed earlier in the design cycle, to reduce expensive redesigns later on and to reduce the cost and time spent on field trials. LTE Development Mode for Detailed Protocol Logging and Analysis Aimed at protocol stack development and integration, the 7100 Development Mode provides advanced logging capabilities for L1, L2 and L3 protocol layers to debug and resolve issues during development. Message filtering and search functions are provided to facilitate navigation. Customized test scenarios using all LTE sub-layers can be easily created with the Scenario Wizard using the simple drag-and-drop graphical interface. Handover and Inter-RAT Testing The 7100 Digital Radio Test Set enables emulation of Inter-Radio Access Technology (InterRAT) system selection and system reselection procedures, circuit switched fall back and handover. Inter-RAT testing can be performed between LTE and WCDMA, HSPA, 1xRTT, eHRPD, GSM, and TD-SCDMA with a single 7100 Radio Test Set. Service Test The 7100 Service Mode provides support for LTE Go/No-Go call mode service testing covering all of the required transmitter and receiver tests. This solution is integrates the well-established Lector/Scriptor application which offers the perfect test environment for service and reverse logistics testing of mobile devices. The 7100 provides LTE test capabilities that, in conjunction with the Aeroflex service products 2201/4400, to provide complete testing for all RATs supported by the modern smartphone, e.g. WCDMA, GERAN, CDMA and TD-SCDMA
PXI 3000 Series LTE Manufacturing Test Equipment LTE UE Manufacturing Throughput The PXI 3000 Series offers LTE device and component manufacturers a proven, fast and flexible solution that addresses the challenges of LTE production testing. Aeroflex designed its LTE manufacturing test solution to maximize the benefits the Aeroflex PXI 3000 Series delivers to leading mobile device and chipset manufacturers worldwide. Built upon the success and experience gained from pioneering R&D test systems from Aeroflex, the PXI 3000 LTE measurement suite achieves similar measurement performance with the benefits of increased speed and flexibility derived from the modular PXI platform. This enables a smooth transition from product development to volume production for LTE manufacturers seeking to rapidly respond to the ramp to volume in LTE devices while maintaining quality and reducing costs. The PXI 3000 Series uses several techniques to maximize manufacturing throughput and yield in device testing, enhancing the ability to rapidly respond to market demand. Parametric testing Parallel testing Multi-standard support Accurate characterization of RF functionality achieving high first pass yield Draw upon the power of multi-core processors to perform concurrent processing and data capture for system test Complete the entire range of tests required for LTE and legacy standards co-existing in the device to increase production throughput The PXI 3000 Series LTE Test Capabilities LTE analysis is supported for both FDD and TDD uplink (SC-FDMA) transmissions for all bandwidths, 1.4 MHz to 20 MHz, and modulation types, QPSK, 16QAM and 64QAM. Using any combination of Aeroflex PXI RF digitizers and signal generators enables LTE testing covering all 3GPP frequency bands. In addition to numerical measurement results, the LTE measurement suite provides trace displays for spectrum emission mask, CCDF, constellation plots, EVM vs. Carrier and EVM vs. Symbol. Fully programmable software interfaces using VB, C or .NET enable users to easily modify and adapt the test systems to particular requirements. Uplink and downlink LTE FDD and TDD stimulus response measurements on components used in LTE-based products can also be performed using IQCreator wave generation software. IQCreator is an additional offering with all Aeroflex PXI digital RF signal generator modules. The modularity of the the PXI 3000 platform facilitates gradual capacity expansions as the need arises. Initial systems can be deployed for single antenna devices and when production of UEs with multiple transmit antennas is initiated, the system can be expanded for MIMO support with a simple upgrade.
Multi-Standard Support The consequences of the success of LTE as the point of convergence from most legacy standards means devices will need to simultaneously support older wireless protocols. Devices that integrate LTE and one or more of the multiple legacy standards will inevitably extend the time required for testing, impacting throughput. The modularity of the PXI 3000 software architecture enables testing multiple standards in a single operation, preserving production output. “Testing devices that integrate LTE and one or more of the multiple legacy standards can be achieved in a single operation due to the PXI 3000 software architecture.” Further improvements in throughput are achieved using the same system to test connectivity interfaces such as Bluetooth and wireless LAN in the same test cycle. Given current market trends, and the compatibility of LTE with legacy standards, devices will continue to support a larger number of cellular and connectivity interfaces for some time to come. PXI 3000 Measurement Suites GSM/EDGE UMTS/HSPA CDMA2000/1xEVDO WLAN 802.11a/b/g/n WiMAX Bluetooth LTE FDD and TDD ZigBee Generic demodulation The increased complexity of testing brought forward by the LTE standard requires a flexible and accurate solution capable of improving productivity. The PXI 3000 Series is ideally suited for LTE device manufacturing tests, achieving remarkable throughput improvements without sacrificing accuracy and performance.
S-Series Digital Signal Generators and Vector Signal Analyzers SGD – Digital Signal Generators The SGD employs a large touch-screen user interface to provide a digital signal generator with unparalleled ease of use. The small form-factor and light weight ensure a minimum footprint on the bench or test system and maximum portability. The wide bandwidth IQ modulator exhibits excellent dynamic range enabling the most demanding amplifier and receiver selectivity measurements to be performed. The use of Aeroflex’s Fast Low Noise Synthesis (FLNS) technology, added to the experience gained through decades of developing leading-edge signal source products, ensures that signal purity and integrity have not been sacrificed in the quest for speed. With a comprehensive range of features and options, the SGD meets the needs for a general purpose signal generator while offering the high performance required of demanding, critical receiver measurements or rapid manufacturing. The SGD features an embedded version of IQCreator that is capable of supporting the different LTE bandwidth settings – 1.4 MHz, 3 MHz, 5 MHz, 10 MHz and 20 MHz – in accordance with the standard. The default full carrier allocation can be overridden by customizing the resource block to carrier level. Parameters for the physical channels and physical signals can be configured on a frame and subframe basis. In particular, the PDSCH channel modulation can be set to be QPSK, 16QAM or 64QAM. Further testing flexibility is allowed by setting up different data sources to any of the uplink or downlink channels. Choices are available for using the PRBS, all zeros, all ones, random bits, repeating patterns, or any type of user data from a file. Key features are: Wide band cover: SGD-3 - 100 kHz to 3 GHz SGD-6 - 100 kHz to 6 GHz 13 dBm output ( 20 dBm option) 3GPP ACLR -71 dBc IQ modulator with 300 MHz RF bandwidth Up to 250 MS/s dual channel arbitrary waveform generator with memory options up to 1 GSample Low SSB phase noise: –135 dBc/Hz at 1 GHz Fast frequency settling time: 100 μs SGD and SVA 8
SVA – Vector Signal Analyzers The SVA converts RF signals into digital IF or I&Q sampled data, providing vector signal analysis of RF signals with functionality and performance required in the laboratory or the manufacturing test system. With high linearity, low noise and excellent level accuracy, the SVA is ideally suited for the analysis of LTE and WLAN, WMAN, WPAN, 2G, 3G, 4G cellular radio signals, as well as general purpose analog and digitally modulated signal analysis. A spectrum analyzer mode provides the features and controls you would expect from a conventional spectrum analyzer. Key features are: Wide band cover: SVA-6 - 250 kHz to 6 GHz SVA-13 - 250 kHz to 13 GHz Maximum instantaneous bandwidth: 90 MHz Digital downconverter with sample rates up to 250 MS/s List mode for fast frequency and level settling time: 250 μs Displayed Average Noise Level: typ. -148 dBm/Hz Spurious free dynamic range: 75 dB Intermodulation free dynamic range: 75 dB Up to 512 MByte sample memory LTE FDD and LTE TDD SVA – LTE measurement suite options 107 and 108 The LTE TDD and FDD measurement suites provide a library of measurement functions designed to characterize LTE TDD and FDD signals respectively in accordance with the requirements of ETSI TS 36.521-1.(3GPP release 8.4.0). Power Transmit signal quality: Output RF spectrum emissions: Occupied bandwidth Frequency error Spectrum emission mask Error Vector Magnitude (EVM) Adjacent channel leakage power ratio IQ skew/gain imbalance CCDF Symbol clock error Fast Sequence Tuning (FST) IQ-component (carrier leak) In-band emissions for non allocated RB Spectrum flatness 9
TM500 LTE Test Mobile LTE Infrastructure Testing The TM500 LTE product range is a major development by Aeroflex to support the current and future technologies based around 3GPP’s LTE and LTE-A programs. Based upon a scalable software defined radio platform, the TM500 Test Mobile provides a set of product options targeting development, testing and demonstration of 3GPP LTE and LTE-A infrastructure equipment. The first LTE TM500 product was launched in 2007 and since then the product range has expanded in order to address all the critical aspects of the LTE network testing. Single UE, multiple UEs (targeting scheduler, load and capacity test) and multiple cell capabilities are now provided across the product range. FDD and TDD 3GPP standards are fully covered, and full test coverage capabilities (from RF to protocol) are provided. LTE-A support has recently been added, while timely 3GPP specification tracking continues to be provided. Support for all the 3GPP specified RF bands is provided through dedicated radio cards per band (supporting lab and over the air operations) or multi-band radio card (covering the frequency range 400 MHz – 4 GHz and suitable for lab operations only). The TM500 is now used by all the major infrastructure vendors worldwide and is the leading E-UTRA base station test equipment. With its layered operation and automation interfaces, the TM500 LTE and LTE-A can operate within an automated or wrap-around test configuration. LTE Layer 1 Layer 2 The TM500 LTE FDD Layer 1/Layer 2 product provides full 3GPP LTE functionality of PHY, MAC, and RLC layers supporting 3GPP category 2, 3, 4, 5 for LTE UEs and 6 (2 layers) for LTE-A UEs. These provide up to 4x4 DL MIMO for LTE UEs and carrier aggregation of 2 carriers (2x2 per carrier) on LTE-A UEs with data rates up to 300 Mbps DL, 75 Mbps UL. The TM500 Single UE and Multi UE incorporate test modes for an incremental, layered approach to development and testing of the LTE stack. Specific test modes targeting HARQ, MAC, RLC and PDCP operation are provided. These modes enable detailed functionality to be tested at a modular level and, thus, very early testing of eNode B features. Operation of the TM500 LTE is via the Aeroflex integrated and flexible control and logging user interface (the TMA). The TMA provides a set of comprehensive control, measurement, data logging, display, and analysis tools for use at all layers. Control override of DL HARQ operation The TM500 LTE can also be operated via an external automated or wrap-around test system. The TM500 additionally supports enhanced test features, including the scripted override of Layer1/Layer2 control information, enabling early test of closed control loops or to simulate error or fault conditions.
LTE Higher Layers A “single box” solution is available for 3GPP LTE testing with Higher Layers supporting Release 10 features. This adds full PDCP, RRC, NAS and USIM functionality to the baseline TM500 LTE Layer 1/Layer 2 product. The full 3GPP LTE compliant stack is embedded within the TM500 LTE platform thereby removing the need for an external or third party Layer 3 solution, and moreover minimizing Layer 3 latencies. The TM500 LTE simulates the behavior of a real handset with USIM and AT command interfaces, but with the added advantage of full control and logging of all Layer 1, 2, and 3 operations via a single common front end GUI for configuration. There are also test features including scripted control of measurement reports, handover, Self Organizing Network (SON) features such as Automatic Neighbour Relations (ANR) and negative test scenarios. The TM500 LTE higher layers TM500’s modular software design also enables it to be incorporated into automated and wrap-around test systems with control either at PDCP level or via AT commands at NAS level. LTE Multiple UE Solutions Aeroflex’s TM500 product family includes multiple UE test solutions capable of functionality, system and capacity testing whereby thousands of UEs are supported to stress test scheduling algorithms, handover performance of eNodeBs and the network in high load conditions. The E500 is a capacity tester capable of end-to-end testing with Evolved Packet Core and EUTRAN emulation attributes. The multiple UE solutions can emulate ‘Real World’ scenarios from mobility to real data applications such as HTTP, P2P, FTP and VoIP. Moreover, Aeroflex’s multiple UE solutions are scalable to support thousands of UEs and more cells with excellent diagnostics, comprehensive measurements with high visibility of key UE to cell KPI’s beneficial for faster troubleshooting and network optimization. Aeroflex’s LTE TM500 platform is designed to be future-proof and currently supports the latest 3GPP functionality for Release 9, 10 with readiness for Release 11. Current support includes eMBMS [enabling the broadcast] of IP based services such mobile TV and localized news, dual layer beamforming, which enhances data throughputs, and support for higher data rates up to DL 300 Mbps and UL 75 Mbps using 4x4 DL MIMO. Release 10 capabilities include LTE-A carrier aggregation technology, which enables the use of additional carriers to achieve greater than 1 Gbps in the DL, and eICIC, which is an interference management technology to enhance data throughputs. Aeroflex constantly monitors 3GPP developments and closely works with its customers to aligns its roadmap in order to develop new options, tools and test features as cellular technology advances. The TM500 LTE provides a clear migration path through the powerful and scalable Software Defined Radio platform. This not only supports the future LTE/LTE-A technology roadmap, but also provides value to users by allowing the maximum re-use of hardware to support new features.
E500 Capacity Test System title name The E500 provides true end-to-end LTE load testing over an RF connection to an LTE eNodeB (eNB). A scalable number of UEs are provided that can simulate from hundreds to tens of thousands of active wireless subscribers per cell. The E500 benefits from the Aeroflex RF TM500 LTE Test Mobile technology, the defacto industry standard used by network equipment vendors for base station development. The use of Aeroflex’s LTE RF solution provides access to the most widely deployed UE RF test solution worldwide that reduces E500 integration time from months to days. Furthermore, it enables E500 customers to benefit from a leading-edge 3GPP roadmap delivering critical functionality as required to roll out LTE and LTE-A. Applications E500 can be used for: Base station and LTE network load test Base station and LTE network regression test Demonstrating capability and understanding the impact of new 3GPP functionality including LTE-A Replicating field issues in a controlled lab environment LTE end-to-end quality of service measurement Base station scheduler testing under varying UE load conditions ‘Real-world’ RF channels and data testing in a lab environment Real LTE data bearer services such as VoIP calls, FTP data, web browsing and video broadcasts can be verified by using sophisticated application data generation features of the E500. This enables end-user quality of experience measurements to be made based upon real data application traffic.
Quick Facts 1. Leading 3GPP functionality from Aeroflex TM500 Test Mobile 2. Supports true LTE load testing over the RF interface in FDD and TDD environments 3. Simulates from hundreds to thousands of LTE UEs over one to multiple cells 4. Comprehensive measurements for trouble-shooting from Layer 1 to NAS 5. Mobility and traffic simulation scripting for easy simulation of thousands UEs with different traffic and mobility scenarios. 6. Generate different traffic profiles using real data services and applications 7. Supports remote access and multiple users 8. Capable of simulating a user plane load exceeding the capacity of an eNodeB 9. Based on a high-performance hardware platform ready for 4x4 MIMO and extendable for LTE-A Capacity Hardware A dedicated cabinet hardware system has been designed to support capacity testing. Two cabinet sizes are supported; 1. 29U Cabinet supports 2 or 3 cells 2. 38U Cabinet supports 6 cells The cabinets include front panel connectors for both RF and control. Each individual cell connection is capable of supporting the maximum cell throughput: up to 150 Mbps for 2x2 MIMO and 300 Mbps for 4X4 MIMO. They have been designed to be able to internally accommodate the additional hardware required to support 4X4 MIMO with Category 5 UEs. Existing TM500 Platform C bench top units may also be upgraded for use as part of an LTE capacity test system, for example to provide additional cell capability to supplement an existing Cabinet system. Upgraded TM500 bench top units may be used to form capacity systems of up to 3 cells, where it is important to be able to physically relocate bench top units if required (e.g. for drive testing using Single-UE software). All hardware remains capable of operating Aeroflex single-UE and multi-UE software using the PC-based Aeroflex Test Mobile Application, subject to the necessary software licensing. Please refer to the functionality matrix document for further details of the technical capabilities of each hardware form factor and current supported usage configurations.
Success Stories and Technical Expertise Aeroflex’s extensive commitment to LTE reflects the decision of both GSM/UMTS and CDMAbased network operators worldwide to implement LTE as the mobile broadband technology of choice for their next-generation networks. Aeroflex has already demonstrated its ability to deliver early solutions for the design, development, and deployment of both LTE terminals and network infrastructure with the Aeroflex 7100 and the TM500, respectively. At Aeroflex, we have clearly demonstrated that we have the pedigree to meet the LTE test challenge, having already delivered a comprehensive portfolio of solutions designed to satisfy a variety of LTE test requirements. However, our commitment does not end here. We are continuing to futher the development of solutions covering all aspects of LTE/LTE-A test to achieve our objective of being the most complete global supplier of LTE test equipment. “With the aggressive LTE technology demonstration and roll-out plans of both equipment suppliers and network operators, the need for the early availability of these test systems has become paramount.” Technical Expertise Being a key player in the development of testing systems for the LTE standard since its inception, Aeroflex boasts a strong network of expert engineers with the ability to address the technical challenges of LTE testing. Such broad resources and technical expertise are available to customers worldwide to guarantee the test system performs at optimal levels and time-to-market is not jeopardized.
Summary of Key Features 7100 Key Features LTE FDD and TDD signalling network emulation Multi-cell and Inter-RAT handover support Multi-functional testing for RF, performance, protocol 6 GHz frequency range, covering all LTE spectrum allocations and bandwidths Integrated protocol stack Comprehensive logging, control, display, and analysis tools PXI 3000 Key Features High speed, scalable modular architecture Comprehensive parametric characterization of LTE FDD and TDD signals Support for multi-standard tests (2G, 3G, Bluetooth and WLAN) Standard programmable interfaces (VB, C and .NET) Concurrent asynchronous processing with multi-core processors 3 GHz or 6 GHz frequency range S-Series Key Features IQ modulator with 300 MHz RF bandwidth Up to 250 MS/s dual channel arbitrary waveform generator with memory options up to 1 GSample Embedded IQCreator waveform generation tool Fast frequency settling time: 100 μs TM500 Key Features 3GPP LTE FDD and TDD L1, L2, RRC and full system level modes Single UE, multi-UE and capacity test solutions 150 Mbps, 20 MHz, MIMO, multiple RF bands, and CPRI Cabled or over the air operation Comprehensive logging, control, display, and analysis tools E500 Key Features In use globally with multiple major operators and vendors The most realistic LTE capacity test platform available Easy to use, KPIs to measure network performance Benefits from leading edge TM500 3GPP roadmap
CHINA Beijing Tel: [ 86] (10) 6539 1166 Fax: [ 86] (10) 6539 1778 CHINA Shanghai Tel: [ 86] 21 2028 3588 Fax: [ 86] 21 2028 3558 CHINA Shenzhen FRANCE GERMANY INDIA Tel: [ 86] (755) 3301 9358 Fax: [ 86] (755) 3301 9356 Tel: [ 33] 1 60 79 96 00 Fax: [ 33] 1 60 0177 69 22 Tel: [ 49] 89 99641 0 Fax: [ 49] 89 99641 160 Tel: [ 91] (0) 80 4115 4501 Fax: [ 91] (0) 80 4115 4502 JAPAN Tel: [ 81] 3 3500 5591 Fax: [ 81] 3 3500 5592 KOREA Tel: [ 82] (2) 3424 2719 Fax: [ 82] (2) 3424 8620 SCANDINAVIA SINGAPORE TAIWAN UK USA Tel: [ 45] 9614 0045 Fax: [ 45] 9614 0047 Tel: [ 65] 6873 0991 Fax: [ 65] 6873 0992 Tel: [ 886] (2) 2698 8058 Fax: [ 886] (2) 2698 8050 Tel: [ 44] (0) 1438 742200 Fax: [ 44] (0) 1438 727601 Freephone: 0800 282388 (UK only) Tel: [ 1] (316) 522 4981 Fax: [ 1] (316) 522 1360 Toll Free: 800 835 2352 (US only) Our passion for performance is defined by three attributes represented by these three icons: solution-minded, performance-driven and customer-focused. w w w.aeroflex.com info-test@aeroflex.com As we are always seeking to improve our products, the information in this document gives only a general indication of the product capacity, performance and suitability, none of which shall form part of any contract. We reserve the right to make design changes without notice. All trademarks are acknowledged. Parent company Aeroflex, Inc. Aeroflex 2013. Part No. 46891/580 Issue 4 09/13
Aeroflex delivered the world's first LTE test mobile in 2007 and has since established itself as a leader in LTE test with an in-depth understanding of the LTE standards, the essential elements that define system performance, and the key test requirements that guarantee flawless deployment. Aeroflex has also worked with major vendors to publicly
Apr 05, 2017 · Cisco 4G LTE and Cisco 4G LTE-Advanced Network Interface Module Installation Guide Table 1 Cisco 4G LTE NIM and Cisco 4G LTE-Advanced NIM SKUs Cisco 4G LTE NIM and Cisco 4G LTE-Advanced NIM SKUs Description Mode Operating Region Band NIM-4G-LTE-LA Cisco 4G LTE NIM module (LTE 2.5) for LATAM/APAC carriers. This SKU is File Size: 2MBPage Count: 18Explore furtherCisco 4G LTE Software Configuration Guide - GfK Etilizecontent.etilize.comSolved: 4G LTE Configuration - Cisco Communitycommunity.cisco.comCisco 4G LTE Software Configuration Guide - Ciscowww.cisco.comCisco 4G LTE-Advanced Configurationwww.cisco.com4G LTE Configuration - Cisco Communitycommunity.cisco.comRecommended to you b
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TD-HSDPA/HSUPA: 2.8Mbps DL, 2.2Mbps UL EDGE: Multi Slot Class 12 236.8 kbps DL & UL GPRS: Multi Slot Class 10 85.6 kbps DL & UL Frequency Bands: LTE Band B1 (2100MHz) LTE Band B2 (1900MHz) LTE Band B3 (1800MHz) LTE Band B4 - AWS (1700MHz), LTE Band B5 (850MHz), LTE Band B7 (2600MHz) LTE Band B8 (900MHz) LTE Band B12 (700MHz) LTE
ETSI is the copyright holder of LTE, LTE-Advanced and LTE Advanced Pro and 5G Logos. LTE is a trade mark of ETSI. Grandmetric is authorized to use the LTE, LTE-Advanced, LTE-Advanced Pro and 5G logos and the acronym LTE. All information that will be discussed is provided "as is" and Grandmetric gives no guarantee or warranty that the information
Cisco Fourth-Generation LTE Network Interface Module Installation Guide Hardware Overview Hardware Overview Cisco 4G-LTE NIM addresses the modular 4G-LTE cellu lar connectivity on the Cisco 4000 Series ISRs. Cisco 4G-LTE-NIM is feature-compatible with Cisco EHWIC-4G-LTE. Table 1 describes the Cisco 4G LTE
LTE Specifications Frequency Band LTE-FDD Band 2: UL 1850MHz - 1910MHz 1930MHz - 1990MHz DL LTE-FDD Band 3: 1710MHz - 1785MHz 1805MHz - 1880MH LTE-FDD Band 7: 2500MHz - 2570MHz 2620MHz - 2690MHz LTE-FDD Band 28B: 718MHz - 748MHz 773MHz - 803MHz LTE-TDD Band 42: 3400MHz - 3600MHz Non 3GPP-band TDD 1785MHz - 1805MHz 1900MHz .
receivers, Signal Studio for LTE and LTE-Advanced FDD/TDD enables you to import W-CDMA/HSPA, GSM/ EDGE, cdma2000/1xEV-DO, TD-SCDMA, LTE TDD/FDD, and WLAN waveforms from other Signal Studio products. The new waveform library manager, which requires Option JFP, can help you manage imported waveforms. Multiple sample rate waveforms can
