PRODUCT QUALIFICATION TEST REPORT

PRODUCT QUALIFICATIONTEST REPORTGL 49SNC Series Construction Change QUAL49S SMD - Minature Quartz CrystalFor a listing of Standard/Legacy part numbers and Custom partnumbers at the time of Qualification - Refer to Appendix AApprovals: On FileRock ChangDirector of QualityPSE Technology, a Pericom CompanyBrian D. ConwayDirector - Quality SystemsPericom SemiconductorDate: Oct-2010P. FinerSinLin HsuPrepared by;Sr. Quality EngineerQuality EngineerThe Contents of this document are to be treated as strictly confidential and proprietary in nature and are not to be reproduced, used, or disclosedoutside of the receiving company except as authorized by Pericom/SaRonix-eCera.

ContentsSectionItemPage1Abstract32Purpose33Scope and Contents34Reference Documents35Equipment46Outside Facilities47ESD Precautions48Justification for Qualification by similarity49Tests and Results Summary Matrix510Qualification conformance test data Package :6-1711Conclusion1812AppendicesSummary Sheet19Product Data Sheet20-22A - Part Number Listing23The Contents of this document are to be treated as strictly confidential and proprietary in nature and are not to be reproduced, used, ordisclosed outside of the receiving company except as authorized by SaRonix-eCera/Pericom.

1.0 AbstractThe purpose of this report is to present the Qualification test results of the Pericom/SaRonix-eCeraGL 49SNC Minature Quartz Crystals.The Pericom/SaRonix-eCera GL 49SNC Quartz Crystals are minature AT-strip lead-free crystal resonatorshoused in a 49S package. The crystals are housed in a low profile package with SMD adapter for surfacemounting. The parts utilize a proven, low cost, metal package technology with a precision molded based anduniversal contact configuration.The product features a rugged AT-strip crystal construction and a SMD package. The product series isideally suited for Set-Top Box, Multimedia, Network Adapter Cards, Modems, Remote Control devices andother hand held products.The information contained herein represents proof of product Reliability and Performance for thePericom/SaRonix-eCera GL 49SNC Quartz Crystals in accordance with the generic specification afterexposure to a variety of environmental and mechanical events that occur during the installation andoperational lifetime of the product.Upon conclusion of the testing the product continued to operate within specification limits, demonstrating itscapability of reliable operation throughout its lifetime.2.0 PurposeThe purpose of the qualification is to verify the epoxy material 3301F construction integrity of connecting thecrystal lead to the SMD adapter for the Pericom/PSE 49SNC products3.0 Scope and ContentsThe report describes the qualification test program, procedures utilized, criteria enforced (at the time ofproduct validation), and specific result data obtained during the testing of three lots of Quartz Crystals. Thethree lots consisted of an equal number of units from different part numbers and date codes to ensuremanufacturing repeatability. Where possible the different options from the design series such as operatingfrequency, frequency stability were selected to demonstrate compliance across the full design range.4.0 Reference DocumentsPericom/SaRonixeCera DataSheet(s)Data Sheet DS-153 for the 49S SMD productsQAP81SaRonix Frequency Control Products Qualification Assurance ProcedureJESD22Reliability Test Methods for Packaged DevicesMIL-STD-883Test Methods and Procedures for Electronic DevicesJ-STD-020CMoisture/Reflow Sensitivity Classification for Non-Hermetic Solid State SurfaceMount Devices (Table 4.2 and 5.2)The Contents of this document are to be treated as strictly confidential and proprietary in nature and are not to be reproduced, used, or disclosed outside of thereceiving company except as authorized by Pericom/SaRonix-eCera.

5.0 EquipmentSaunders & Associates Model 2200A or W2200 Crystal Temperature Test System.Consisting of:S&A PI Network, or equivalentPTS Model 620 Frequency SynthisizerAgilent Model 8508A Vector VoltmeterS&A Model 4220 Temperature Test Chamber or equivalentSaunders & Associates Model 250B and/or 250C Crystal Test SystemDigital Thermometer, Fluke Model 51 or equivalentConvection Oven, Blue M Mechanical or equivalentDigital Calipers, Mityoto or equivalentNote: All test equipment has been optimized for radio frequency signal transmission andrecording; however, certain physical limitations in the equipment and associated fixturing willcontribute to variations in results.The electrical test data contained herein consists of summaries of room temperature operatingFrequency and ESR before and after each stress test. Detailed electrical performance, includingFrequency, resistance, C1, C0, L1, DLD, and Q at various operating frequencies are available onrequest.All electrical testing was performed using a test system comprised from the calibrated equipmentlisted above.6.0 Outside FacilitiesNone7.0 ESD PrecautionsCrystals are not considered static sensitive devices as designated by Category A of MILSTD-883, Method 3015.8.0 Justification for Qualification by similarityThis report draws on the commonly utilized method of 'qualification by similarity' to justify thequalification of the Pericom/SaRonix-eCera GL 49SNC and all related custom (SRX) part numberderivatives Quartz Crystals.It is the policy of Pericom/SaRonix-eCera that in some specific cases, qualification may bepresumed by similarity, e.g. When a group of devices is in the same functional category,manufactured with the same crystal fabrication processes, crystal processing line/location anddesign rules, the same packaged with the same packaging technology, and on the samepackaging line/location, they can be qualified by similarity.The Contents of this document are to be treated as strictly confidential and proprietary in nature and are not to be reproduced, used, or disclosedoutside of the receiving company except as authorized by Pericom/SaRonix-eCera.

Stress / Test:TEST SUMMARY MATRIXPart Number:Freq:Test Date:Test Condition:GL Series3.6864 MHz; 16.6700 MHz; 25.0000 MHzVarious - 2010Refer to Table belowReference: Pericom/SaRonixQAP 81 DocumentationQuantity:# of Lots:Sample Size:Result:3See belowPassSummary:#Stress / TestAbbvReferenceNumber of LotsSample Size perLotAccept on #Failures35033003200Test Conditions / Additional RequirementsResultInitial1Physical DimPDInternal Master SpecificationJESD22-B100PASSMil Std 883 M20162Gross/Fine LeakGFLJESD22-A109Mil Std 883 M10143Electrical CharacterizationEDSaRonix Data Sheet4Electrical TestTSTSaRonix Data Sheet5Mechanical ShockMSJESD22-B1043206Vibration Variable FrequencyVVFJESD22-B1033207SolderabilityFine Method 1014 Cond A1PASSGross Method 1014 Cond C1Full parameter ATE test Aging projectionPASSTo be performed pre and post each stress/testPASS01500g peak 0.5ms pulse, 5 pulses in each of6 directionsPASS020g peak 20-2000Hz, in each of 3 directionsPASSAll parts in QualMechanicalSDJ-STD-002 (SMD)*350Lead Free criteria if applicablePASSJESD22–B102 (TH)8Marking PermanencyMPJESD22-B107PCJESD22- A113NANot required for laser marked devicesN. A.Perform before THB (or HAST) , TC and AC tests, post test SAMrequiredN. A.85 C / 85% RH 1008HrsN. A.Environmental9Preconditioning of non-hermeticdevices / Moisture resistance10Steady State Temp Humidity Bias LifeTHBJESD22-A10111Highly Accelerated Stress TestingHASTJESD22-A110All samples to be submitted through THB (or HAST), TC and ACtestsNA130 C/85%RH, 96Hrs orNAN. A.110 C/85%RH, 264Hrs/ A11812Accelerated Moisture Resistance Autoclave / Pressure Cooker TestACJESD22-A102NA13Temp CycleTCJESD22-A104316Resistance to Solder Heat(SMD parts)121 C 100%RH 15psig 96Hrs300JESD22–B106 (TH)PASSPost test SAM requiredMil Std 883 M1010RSHN. A.-55C/125C, 1000 cycles3200High Temp/Lead Free criteria if applicablePASSJ-STD-020C (SMD)18Low Temp StorageLTSJESD22-A11919High Temp Storage Life / BakeHTBJESD22-A103JIS C 6701-199927AgingAgXtal-MIL-PRF-3098100 Hrs –55 CNAN. A.720 Hours @ 125 C, 2Hrs @25 before testingNAN. A.M4.7.14 30 days (720 hrs) @ 85 C, Interrupttest for electrical measurement at 24hrs andeach 48hrs - 96hrs there after.N. A.0De-lid for DPA inspections / testsPASSPlastic packages to be X-RayedPASSNAPackage Tests29Destructive Physical AnalysisDPAMil Std 883 50093532-IVWMS-0035033External VisualEVWMS-0035034Lead Integrity (If applicable)LIJESD22-B105Internal Visual350Note:Internal Moisture AnalysisRGAN. A.8 ounces plastic packageMil Std 883 M200428PASS2 pounds through hole320 5000 ppmN. A.- Qualification test matrix above was generated as qual specific extract from SaRonix Quality Assurance Procedure QAP81 (Frequency Control ProductsQualification).- The stress test conditions as detailed in this qualification are representative of the most frequently encountered and accepted reliability stress tests, andare equivalent to the referenced environmental/mechanical conditions referenced on the product data sheets. The test summary matrix referenced andprogram undertaken is based on the JESD47B ‘Stress-Test-Driven Qualification of integrated Circuits’Qualification Report GL 49SNC Series Construction Change QUAL

4Stress / Test:PHYSICAL DIMENSIONSReference:Part Number:Freq:Test Date:GL Series3.6864 MHz; 16.6700 MHz; 25.0000 MHz1-Oct-10Digital calipersQuantity:Test Condition:Result:Mechanical Inspection Report49SNC03.6864-20HJE-EPart 8400MinMaxTyp13.300-5.200-5.500-DLot #2Part 8600MinMaxTyp13.300-5.200-5.500-Part 8400MinMaxTyp13.300-5.200-5.500-Lot # of Lots:Sample Size:Results Summary:Lot #1MIL-STD-883 Method 20161039EFGL 49SNC OUTLINE DIAGRAMACBQualification Report GL 49SNC Series Construction Change QUALG35Pass

Stress / Test:MECHANICAL SHOCKReference:Part Number:Freq:Test Date:Test Condition:GL Series3.6864 MHz; 16.6700 MHz; 25.0000 MHz6-Oct-20101500g peak, 0.5ms pulse 5 pulses in eachdirectionsQuantity:JESD22-B104# of Lots:Sample Size:Passof 6Results Summary:Lot #149SNC03.6864-20HJE-E1039EFreq Dev (ppm)ESR Dev (ohm)PrePostFl Δ (ppm)PrePostESR Δ 4.21Failures0Freq (ppm)ESR 200Pre ShockPost ShockLot #2Pre ShockSRX5920-EPost Shock1039EFreq Dev (ppm)ESR Dev (ohm)PrePostFl Δ (ppm)PrePostESR Δ ailures0Freq (ppm)ESR (ohms)50403020100-10-20-30-40-5050403020100Pre ShockPre ShockPost ShockLot #349SNC25.0000-20GGC-EPost Shock1039EFreq Dev (ppm)ESR Dev (ohm)PrePostFl Δ (ppm)PrePostESR Δ ailures0ESR (ohms)Freq (ppm)5050403020100-10-20-30-40-50403020100Pre ShockPost ShockPre ShockQualification Report GL 49SNC Series Construction Change QUAL320Post Shock

Stress / Test:VIBRATIONReference:Part Number:Freq:Test Date:Test Condition:GL Series3.6864 MHz; 16.6700 MHz; 25.0000 MHz12-Oct-201020g peak, 20-2000Hz X, Y & ZQuantity:JESD22-B103# of Lots:Sample Size:PassResult:Results Summary:Lot #149SNC03.6864-20HJE-E1039EFreq Dev (ppm)ESR Dev (ohm)PrePostFl Δ (ppm)PrePostESR Δ 151.79Failures0Freq (ppm)ESR 200Pre VibPre VibPost VibLot #2SRX5920-EPost Vib1039EESR Dev (ohm)Freq Dev (ppm)PrePostFl Δ (ppm)PrePostESR Δ 11Failures0Freq (ppm)ESR (ohms)50403020100-10-20-30-40-5050403020100Pre VibPost VibLot #3Pre Vib49SNC25.0000-20GGC-EPost Vib1039EFreq Dev (ppm)ESR Dev (ohm)PrePostFl Δ (ppm)PrePostESR Δ .01Failures0Freq (ppm)ESR (ohms)50403020100-10-20-30-40-5050403020100Pre VibPost VibPre VibQualification Report GL 49SNC Series Construction Change QUAL320Post Vib